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On-Wafer Noise-Parameter Measurements at NIST

Published

Author(s)

James P. Randa, Dave K. Walker

Abstract

NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. In this paper we briefly describe the measurement methods and the uncertainty analysis and present results of measurements on a very poorly matched transistor.
Conference Dates
July 9-14, 2006
Conference Location
Turin, 1, IT
Conference Title
Conference on Precision Electromagnetic Measurements

Keywords

noise, noise measurement, noise parameter, on-wafer measurement, transistor noise

Citation

Randa, J. and Walker, D. (2006), On-Wafer Noise-Parameter Measurements at NIST, Conference on Precision Electromagnetic Measurements, Turin, 1, IT, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32179 (Accessed April 23, 2024)
Created July 13, 2006, Updated October 12, 2021