Randa, J.
and Walker, D.
(2006),
On-Wafer Noise-Parameter Measurements at NIST, Conference on Precision Electromagnetic Measurements, Turin, 1, IT, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32179
(Accessed January 20, 2025)
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On-Wafer Noise-Parameter Measurements at NIST
Published
Author(s)
,
Abstract
NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. In this paper we briefly describe the measurement methods and the uncertainty analysis and present results of measurements on a very poorly matched transistor.Conference Dates
July 9-14, 2006
Conference Location
Turin, 1, IT
Conference Title
Conference on Precision Electromagnetic Measurements
Pub Type
Conferences
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Keywords
noise, noise measurement, noise parameter, on-wafer measurement, transistor noise
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created July 13, 2006, Updated October 12, 2021