NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. In this paper we briefly describe the measurement methods and the uncertainty analysis and present results of measurements on a very poorly matched transistor.
July 9-14, 2006
Turin, 1, IT
Conference on Precision Electromagnetic Measurements
and Walker, D.
On-Wafer Noise-Parameter Measurements at NIST, Conference on Precision Electromagnetic Measurements, Turin, 1, IT, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32179
(Accessed June 6, 2023)