U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 33401 - 33425 of 73960

Random-Effects Model for Meta-analysis of Clinical Trials: An Update

January 1, 2007
Author(s)
Rebecca DerSimonian, Raghu N. Kacker
The random-effects model is a useful approach for meta-analysis of clinical studies. It explicitly accounts for the heterogeneity of studies through a statistical parameter representing the inter-study variation. We discuss several iterative and non

Randomized Benchmarking of Quantum Gates

January 1, 2007
Author(s)
Emanuel Knill, D. Leibfried, R. Reichle, J. Britton, R. B. Blakestad, J. D. Jost, C. Langer, R Ozeri, Signe Seidelin, David J. Wineland
A key requirement for scalable quantum computing is that elementary quantum gates can be implemented with sufficiently low error. One method for determining the error behavior of a gate implementation is to perform process tomography. However, standard

Reflections on Sunlight-or Daylight-Readability

January 1, 2007
Author(s)
Edward F. Kelley
Trade magazine discussion of the need for better sunlight-readability measurement methods based upon ambient contrast measurements. Diffuse reflectance measurements and directed illumination measurements are combined and scaled to daylight levels to

Report of the Workshop on Reliability Issues in Nanomaterials

January 1, 2007
Author(s)
Robert Keller, David T. Read, Roop L. Mahajan
The Workshop on Reliability Issues in Nanomaterials was held at the Boulder Laboratories of the U. S. Department of Commerce on August 17-19, 2004. It was organized by the National Institute of Standards and Technology (NIST) and was designed to promote a

Results of a Nanoindentation Round Robin on Thin Film Copper on Silicon

January 1, 2007
Author(s)
David T. Read, Robert Keller, Nicholas Barbosa, Roy H. Geiss
Nanoindentation is used in a variety of fields to measure material hardness and elastic modulus. This test technique is especially attractive for thin films because of the difficulty of conducting tensile or other conventional mechanical characterization
Displaying 33401 - 33425 of 73960
Was this page helpful?