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Displaying 33176 - 33200 of 73830

Higher Order Tip Effects in CD-AFM Linewidth Measurements

January 1, 2007
Author(s)
Ndubuisi G. Orji, Ronald G. Dixson
In critical dimension Atomic force microscopy (CD-AFM), a source of uncertainty is the tip. Measurements made using a CD-AFM tip show an apparent broadening of the width. Usually the results can be approximated if the tip-width is known. In addition to tip

Images of Strips On and Trenches In Substrates

January 1, 2007
Author(s)
Egon Marx
The computation of images of lines or strips on a substrate and trenches in a substrate or a layer above a substrate, all made of dielectric or absorbing materials, using integral equations equivalent to Maxwell's equations and using Fourier optics are

Information Security Guide for Government Executives

January 1, 2007
Author(s)
Pauline Bowen, Elizabeth Chew, Joan Hash
Information Security Guide for Government Executives provides a broad overview of information security program concepts to assist senior leaders in understanding how to oversee and support the development and implementation of information security programs
Displaying 33176 - 33200 of 73830
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