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Resistance-Based Scaling of LF-and MF-Band Thermal Noise Powers



John Labenski, Weston L. Tew, Sae Woo Nam, Samuel P. Benz, Paul D. Dresselhaus, Charles J. Burroughs


A conventional technique for scaling thermal noise power in Johnson Noise Thermometry (JNT) is via resistance ratios. We describe measurements in the low to medium frequency (LF/MF) bands using this approach via correlation methods in the frequency domain. We show that the effects of the mismatch in time constants of the input networks may be empirically treated to extract the noise power ratio in the low frequency limit with uncertainties ~60 mK/K.
IEEE Transactions on Instrumentation and Measurement


ITS-90, JNT, Johnson NoiseThermometry, noise thermometry, resistance ratios, spectral noise power, temperature


Labenski, J. , Tew, W. , Nam, S. , Benz, S. , Dresselhaus, P. and Burroughs, C. (2007), Resistance-Based Scaling of LF-and MF-Band Thermal Noise Powers, IEEE Transactions on Instrumentation and Measurement, [online], (Accessed June 14, 2024)


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Created April 1, 2007, Updated February 19, 2017