U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 29426 - 29450 of 73829

Cooling Mode Fault Detection And Diagnosis Method For A Residential Heat Pump

October 17, 2008
Author(s)
Minsung Kim, Seok H. Yoon, William V. Payne, Piotr A. Domanski
Performance characteristics of a R410A residential unitary split heat pump equipped with a thermostatic expansion valve (TXV) were investigated in the cooling mode under no-fault and faulty conditions. An automated method of steady-state detection was

High Performance Organic Thin-Film Transistors Made Simple Through Molecular Design and Processing

October 17, 2008
Author(s)
Oana Jurchescu, Marina Feric, Behrang H. Hamadani, M. Devin, Sankar Subramanian, Balaji Purushothamanc, John E. Anthony, Thomas Jackson, David J. Gundlach
We report on a simple a method of inducing self-isolation of the thin film transistors via manipulation of the chemical interactions between the organic molecules and the surfaces where they are deposited. We use pentafluorobenzenethiol (PFBT) treatment of

International photomask linewidth comparison by NIST and PTB

October 17, 2008
Author(s)
James E. Potzick, Ronald G. Dixson, Richard Quintanilha, Michael T. Stocker, Andras Vladar, Egbert Buhr, Bernd Bodermann, Wolfgang Hassler-Grohne, Harald Bosse, C.G. Frase
In preparation of the international Nano1 linewidth comparison on photomasks between 8 national metrology institutes, NIST and PTB have started a bilateral linewidth comparison in 2008, independent of and prior to the Nano1 comparison in order to test the

Standardization of Auxiliary Equipment for Next Generation CNC Machining

October 17, 2008
Author(s)
David Odendahl, Sid Venkatesh, John L. Michaloski, Frederick M. Proctor
This paper presents the recent work of the Open Modular Architecture Control (OMAC) Machine Tool Working Group to support STEP-NC, which is a new standard for the exchange of comprehensive Computer Numerical Control (CNC) manufacturing data. Because of the

The Origins of Random Telegraph Noise in Highly Scaled SiON nMOSFETs

October 17, 2008
Author(s)
Jason P. Campbell, Jin Qin, Kin P. Cheung, Liangchun (. Yu, John S. Suehle, A Oates, Kuang Sheng
Random telegraph noise (RTN) has recently become an important issue in advanced circuit performance. It has also recently been used as a tool for gate dielectric defect profiling. In this work, we show that the widely accepted model thought to govern RTN

The transient behavior of NBTI - A new prospective

October 17, 2008
Author(s)
Kin P. Cheung, Jason P. Campbell
The Negative-Bias-Temperature-Instability (NBTI) is currently one of the most serious reliability issues in advanced CMOS technology. Specifically, the fast recovery of NBTI degradation immediately after stress is removed has recently become a hot topic

(235), Martensite: An Inclusion-Theory Explanation

October 16, 2008
Author(s)
H M. Ledbetter, Martin Dunn
We consider what is, perhaps, martensite's greatest crystallographic problem: ferrous martensites with a habit plane p near (225)f, or viewed more recently as nearer (449)f or even (112)f. We predict p within 2.6 degrees of observation and on the (hhl)f

2001 Weights and Measures Directory

October 16, 2008
Author(s)
L T. Sebring
This directory is a listing of weights and measures officials in the U.S. and its territories. It includes the official's agency, title, address, phone, fax, e-mail, and some url addresses.

2004 Weights & Measures Directory, NISTIR 6500 2004 ED

October 16, 2008
Author(s)
L T. Sebring
This directory is a listing of weights & measures Officials in the U.S. and its territories. It includes each official's agency, title address, phone, fax, email, and some URL addresses.

2005 Weights and Measures Directory

October 16, 2008
Author(s)
L T. Sebring
This directory is a listing of weights and measures officials in the U.S. and its territories. It includes each official s agency, title, address, phone, fax, e-mail, and some URL addresses. The directory also contains a listing of NIST WMD staff, areas of

215 - Technical Standards Activities Program

October 16, 2008
Author(s)
S E. Chappell
The Technical Standards Activities Program (TSAP) provides support for public and private sector standards-related activities.TSAP manages:U.S. representation in the International Organization of Legal Metrology (OIML), a treaty organization that promotes

217 - Standards Information Program

October 16, 2008
Author(s)
JoAnne R. Overman
The Standards Information Program (SIP) contributes to the National Institute of Standards and Technology's (NIST's) goals for improving U.S. competitiveness in domestic and world markets and strengthening and advancing the development and use of the

231 - Standard Reference Data Program

October 16, 2008
Author(s)
J R. Rumble
Makes reliable scientific and technical data available to researchers, engineers and many other users. The program generates sets of critically evaluated data and widely disseminates them both as computer databases and publications. The breadth and scope

232 - Standard Reference Material Program

October 16, 2008
Author(s)
J R. Rumble
NIST has pioneered and still leads the development of certified referencematerials for quality assurance of measurements through the StandardReference Materials Program. NIST provides more than 1,200 differentStandard Reference Materials (SRMs) that are

255 - Electronic Information and Publications Program (EIPP)

October 16, 2008
Author(s)
L A. Frederick
The Electronic Information and Publications Program (EIPP) is responsible for the development, implementation and maintenance ofcomputerized information systems in the Office of Information Services and the NIST Publications Program.The EIPP directs the

260 - Office of Weights and Measures

October 16, 2008
Author(s)
H V. Oppermann
Promotes uniformity for over 750 state and local jurisdictions in weights and measures standards, laws, and practices to facilitate trade and protect U.S. businesses and citizens; supports the National Conference on Weights and Measures, an organization of

3D Cellular Morphometrics With Multi-Scale Topographical Constraint

October 16, 2008
Author(s)
A Sehgal, Alamgir Karim, Eric J. Amis
The three dimensional cytoplasmic spread of osteoblast like MC3T3-E1 cells with substrate topography was investigated by atomic force microscopy (AFM). The analysis of AFM images as applied to an ensemble of cells from programmed multiple scans under
Displaying 29426 - 29450 of 73829
Was this page helpful?