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NIST Authors in Bold

Displaying 27976 - 28000 of 73929

Photomask metrology using a 193 nm scatterfield microscope

September 30, 2009
Author(s)
Richard Quintanilha, Bryan M. Barnes, Martin Y. Sohn, Lowell P. Howard, Richard M. Silver, James E. Potzick, Michael T. Stocker
The current photomask linewidth Standard Reference Material (SRM) supplied by the National Institute of Standards and Technology (NIST), SRM 2059, is the fifth generation of such standards for mask metrology. The calibration of this mask has been usually

Quick Capture Platform Graphics

September 30, 2009
Author(s)
Brian C. Stanton, Yee-Yin Choong, Mary F. Theofanos, Patrick Hoffman
This document defines all of the graphic images for the quick capture platform. For each graphic we provide a description, the dimensions, the image, the image name, the use area and the filename containing the graphic image.

System and Network Security Acronyms and Abbreviations

September 30, 2009
Author(s)
Karen A. Scarfone, Victoria Thompson
This report contains a list of selected acronyms and abbreviations for system and network security terms with their generally accepted or preferred definitions. It is intended as a resource for Federal agencies and other users of system and network

Evaluating Speech Translation Systems: Applying SCORE to TRANSTAC Technologies

September 29, 2009
Author(s)
Craig I. Schlenoff, Brian A. Weiss, Michelle P. Steves, Gregory A. Sanders, Frederick M. Proctor, Ann M. Virts
The Spoken Language Communication and Translation System for Tactical Use (TRANSTAC) program is a Defense Advanced Research Projects Agency (DARPA) advanced technology research and development program. The goal of the TRANSTAC program is to demonstrate

Making Mn Substitutional Impurities in InAs using a Scanning Tunneling Microscope

September 29, 2009
Author(s)
Young J. Song, Steven C. Erwin, Gregory M. Rutter, Phillip N. First, Nikolai Zhitenev, Joseph A. Stroscio
We describe in detail a new atom-by-atom exchange manipulation technique using a scanning tunneling microscope probe. As-deposited Mn adatoms (Mnad) are exchanged one-by-one with surface In atoms (Insu) to create a Mn surface-substitutional (MnIn) and an

STEP in a Nutshell

September 29, 2009
Author(s)
Thomas R. Kramer, Xun Xu
This chapter gives an overview of STEP, assuming that the reader may not be familiar with STEP. The chapter gives a short example of an industrial use of STEP. Then it touches briefly on the history and objectives of STEP, followed by the organization of

Guidelines on Firewalls and Firewall Policy

September 28, 2009
Author(s)
Karen A. Scarfone, Paul Hoffman
Firewalls are devices or programs that control the flow of network traffic between networks or hosts employing differing security postures. This publication provides an overview of several types of firewall technologies and discusses their security

Improving Data Quality in Embedded Sensor Systems for APC

September 28, 2009
Author(s)
Julien M. Amelot, YaShian Li-Baboud
Achieving next-generation factory (NGF) goals has been an industry challenge for APC applications to acquire a sufficient level of data quality to maximize the benefits of automation. For example, it is difficult to get accurate timestamps because sensor

Desirable Properties of Voting Systems

September 25, 2009
Author(s)
Svetlana Z. Lowry, Poorvi Vora
This paper provides definitions for some desirable properties of voting systems, including auditability, ballot secrecy, incoercibility, usability and accessibility. In the context of these desirable properties, it defines the class of end-to-end

Measurement Traceability and Quality Assurance in a Nanomanufacturing Environment

September 25, 2009
Author(s)
Ndubuisi G. Orji, Ronald G. Dixson, Aaron Cordes, Benjamin Bunday, John Allgair
A key requirement for nano-manufacturing is maintaining acceptable traceability of measurements performed to determine size. Given that properties and functionality at the nanoscale are governed by absolute size, maintaining the traceability of dimensional

Thermal Diffusivity of H2O near the Critical Point

September 25, 2009
Author(s)
Jan V. Sengers, Richard A. Perkins, Marcia L. Huber, Bernard Le Neindre
The asymptotic critical behavior of the thermal diffusivity of H 2O, deduced from dynamic light-scattering measurements, is shown to be in good agreement with the mode-coupling theory for critical dynamics in fluids. Consistency of the thermal-diffusivity

Development of Soft Armor Conditioning Protocols for NIJ 0101.06: Analytical Results

September 24, 2009
Author(s)
Amanda L. Forster, Kirk D. Rice, Michael A. Riley, Guillaume Messin, Sylvain H. Petit, Cyril Clerici, Gale A. Holmes, Joannie W. Chin
This publication details the four major phases of analytical development work, coupled with several additional side studies, undertaken by the Office of Law Enforcement Standards in writing the Flexible Armor Conditioning Protocol in NIJ 0101.06. This

High-Voltage Capacitance Measurement System for SiC Power MOSFETs

September 24, 2009
Author(s)
Parrish Ralston, Tam H. Duong, Nanying Yang, David W. Berning, Colleen E. Hood, Allen R. Hefner Jr., Kathleen Meehan
Adequate modeling of a power MOSFET is dependent on accurate characterization of the inter-electrode capacitances. With the advent of high voltage silicon carbide (SiC) power MOSFETs, it has become important to develop a measurement system that can perform

Magnetic dynamics with spin transfer torques near the Curie temperature.

September 24, 2009
Author(s)
Paul M. Haney, Mark D. Stiles
In this paper we explore the combined action of large thermal fluctuations and spin transfer torques on the behavior of magnetic layers in spin valves. We find that at temperatures near Tc, spin currents can measurably change the size of the magnetization

Micromachined resonators of high Q-factor based on atomic layer deposited alumina

September 24, 2009
Author(s)
Atif A. Imtiaz, Yuan-Jen Chang, Jason M. Gray, Dragon Seghete, Steven George, Thomas Mitchell (Mitch) Wallis, Pavel Kabos, Charles T. Rogers, Victor M. Bright
In this paper, atomic layer deposited (ALD) alumina (Al2O3) has been demonstrated as the structural material for a micro-resonator for the first time.  An electrostatically actuated micro-bridge made of chromium (Cr) coated ALD Al2O3 was used as a

MEASUREMENTS FOR MECHANICAL RELIABILITY OF THIN FILMS

September 23, 2009
Author(s)
David T. Read, Alex Volinsky
This paper reviews techniques for measurement of basic mechanical properties of thin films. Emphasis is placed on the adaptations needed to prepare, handle, and characterize thin films, and on adaptations of fracture mechanics for adhesion strength. The

Recommendation for Digital Signature Timeliness

September 23, 2009
Author(s)
Elaine B. Barker
Establishing the time when a digital signature was generated is often a critical consideration. A signed message that includes the (purported) signing time provides no assurance that the private key was used to sign the message at that time unless the
Displaying 27976 - 28000 of 73929
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