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Infrared imaging method of measuring growth rate of a hydride phase

Published

Author(s)

Zhuopeng Tan

Abstract

A method of studying growth rate of hydrides using in-situ infrared imaging of wedge-shaped films is presented. Hydrogenation experiments with Pd-capped Mg-Ti films having thickness gradient of 500 nm/cm were conducted at 100 ˚C and 1-5 bar H2 gas pressure. The infrared imaging combined with structural characterizations demonstrated two growth modes; fast formation of a 150 nm-thick layer of MgH2 under Pd followed by dramatically slower growth. This method was validated for a variety of samples with different thickness gradients and compositions, and is expected to be applicable for evaluating hydrogenation kinetics and microstructural requirements of hydrogen storage materials.
Citation
Applied Physics Letters
Volume
35

Keywords

thin film, Mg-Ti, magnesium hydride, IR imaging, kinetics, microstructure

Citation

Tan, Z. (2010), Infrared imaging method of measuring growth rate of a hydride phase, Applied Physics Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=903002 (Accessed March 3, 2024)
Created March 1, 2010, Updated February 19, 2017