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Search Publications

NIST Authors in Bold

Displaying 26701 - 26725 of 73697

Estimating Volumes of Near-spherical Molded Artifacts

May 3, 2010
Author(s)
David E. Gilsinn, Bruce R. Borchardt, Amelia Tebbe
The Food and Drug Administration (FDA) is conducting research on developing reference lung cancer cancer lesions, called phantoms, to test computed tomography (CT) scanners and their software. FDA loaned two semi-spherical phantoms to the National

Gate Dielectrics Year-In-Review

May 3, 2010
Author(s)
Jason P. Campbell
The gate dielectrics year-in-review includes a comprehensive examination of the past year s reports which detail gate stack reliability issues and the corresponding physical mechanisms which limit the performance and lifetimes of advanced devices. The

Novel CaF2 Nanocomposite with High Strength and F Ion Release

May 3, 2010
Author(s)
Hockin D. Xu, Jennifer L. Moreau, Limin Sun, Laurence Chow
Secondary caries and restoration fracture remain the two most common problems. The objectives of this study were to develop stress-bearing, fluoride-releasing nanocomposites. Novel CaF2 nanoparticles (56-nm) were synthesized via spray-drying and

Overview of the TREC-2009 Blog Track

May 3, 2010
Author(s)
Ian M. Soboroff, Craig Macdonald, Iadh Ounis
In TREC 2009, the Blog track has been markedly revamped with the use of a new and larger sample of the blogosphere, cal led Blogs08, which has a 13-month timespan covering a period ranging from 14th January 2008 to 10th February 2009, and the introdu c-

3D shape retrieval based on Multi-scale Integral Orientations

May 2, 2010
Author(s)
Afzal A. Godil, Stephane Bres, Asim Wagan
In this paper we describe a novel 3D shape retrieval method based on Multi-scale Integral Orientations. In our approach, a 3D model after normalization is represented by a set of depth images captured uniformly on a unit circle. Then the shape descriptor

Bilateral comparison of power measurement standards for KrF lasers between PTB and NIST

May 2, 2010
Author(s)
Marla L. Dowell, Christopher L. Cromer, Darryl A. Keenan, Stefan Kuck, Friedhelm Brandt
We report results of the first bilateral laser power comparison for 248-nm KrF excimer lasers accomplished by the National Metrology Institutes of Germany (Physikalisch-Technische Bundesanstalt, PTB) and of the United States of America (National Institute

NBTI: Confusion, Frustration, and Promise?

May 2, 2010
Author(s)
Jason P. Campbell
The negative-bias temperature instability (NBTI) is a reliability problem that, in the last ten years, has risen from relative obscurity to become the most important reliability problem in advanced pMOSFET devices. Even though a significant effort has been

Product Modeling Framework and Language for Behavior Evaluation

May 2, 2010
Author(s)
Jae H. Lee, Steven J. Fenves, Conrad E. Bock, Hyo Won Suh, Sudarsan Rachuri, Xenia Fiorentini, Ram D. Sriram
Supporting different stakeholder viewpoints across the product s entire lifecycle requires semantic richness for representing product related information. This paper proposes a multi-layered product-modeling framework that enables stakeholders to define

SHREC '10 Track: Large Scale Retrieval

May 2, 2010
Author(s)
Zhouhui Lian, Afzal A. Godil, Geert-Jan Giezeman, Ryutarou Ohbuchi, Waqar Saleem, Takahiko Furuya, Thomas Baumbach, Hannah Bast, Joachim Giesen
We present the results of the ULDS track of the shape retrieval contest SHREC 2010. The task was to perform 40 queries in a dataset of 10000 shapes. We describe the methods used by the contestants and discuss the results.

SHREC 10 Track: Generic 3D Warehouse

May 2, 2010
Author(s)
Vanamali ThiruvadandamPorethi, Afzal A. Godil, Helin Dutagaci, Zhouhui Lian, Ryutarou Ohbuchi, Takahiko Furuya
In this paper we present the results of the Shape Retrieval Contest 10 (SHREC 10) of Generic 3D Warehouse. The aim of this track was to evaluate the performances of various 3D shape retrieval algorithms on a large Generic benchmark based on the Google 3D

SHREC 10 Track: Non-rigid 3D Shape Retrieval

May 2, 2010
Author(s)
Zhouhui Lian, Afzal A. Godil
Non-rigid shape matching is one of the most challenging fields in content-based 3D object retrieval. The aim of the SHREC 2010 - Shape Retrieval Contest of Non-rigid 3D Models is to evaluate and compare the effectiveness of different methods run on a non

SHREC 2010: robust large-scale shape retrieval benchmark

May 2, 2010
Author(s)
A M. Bronstein, M M. Bronstein, U Castellani, B Falcidieno, A. Fusiello, Afzal A. Godil, L J. Guibas, I Kokkinos, Zhouhui Lian, M Ovsjanikov, G Patane, M. Spagnuolo, R Toldo
SHREC 10 robust large-scale shape retrieval benchmark simulates a retrieval scenario, in which the queries include multiple modifications and transformations of the same shape. The benchmark allows evaluating how algorithms cope with certain classes of

SHREC'10 Track - Range Scan Retrieval

May 2, 2010
Author(s)
Helin Dutagaci, Afzal A. Godil, Chun Pan (Benny) Cheung
The SHREC 10 Shape Retrieval Contest of Range Scans aims at comparing algorithms that match a range scan to complete 3D models in a target database. The queries are range scans of real objects, and the objective is to retrieve complete 3D models that are

Solutions for Determining Equibiaxial Substrate Strain for Dynamic Cell Culture

May 2, 2010
Author(s)
Martin Y. Chiang, Tianle Cheng, Lisa Pakstis, Joy P. Dunkers
Empirical and analytical solutions are derived in this study to determine the equibiaxial strain on a flexible substrate upon which the cells can be cultured. The empirical formula is based on the mechanistic constraint and a regression analysis of results

Dual frequency combs at 3.4 mm with subhertz residual linewidths

May 1, 2010
Author(s)
Esther Baumann, Fabrizio R. Giorgetta, Ian R. Coddington, William C. Swann, Nathan R. Newbury
Two coherent 1.5-µm frequency combs are transferred to 3.4 µm by difference frequency generation with a 1064 nm cw laser. From a multi-heterodyne measurement, the residual linewidth between the comb teeth is resolution-limited at 200 mHz.

Dual frequency-comb sampling of a quasi-thermal incoherent light source

May 1, 2010
Author(s)
Fabrizio R. Giorgetta, Ian R. Coddington, William C. Swann, Esther Baumann, Nathan R. Newbury
Dual, coherent frequency combs are used to measure the spectrum of an incoherent, quasi-thermal source through Fourier spectroscopy. The source spectrum is acquired over 1THz bandwidth with an absolute frequency accuracy set by the combs.

Fast and accurate comb-based spectral analysis of a frequency agile CW laser

May 1, 2010
Author(s)
Fabrizio R. Giorgetta, Ian R. Coddington, Esther Baumann, William C. Swann, Nathan R. Newbury
The time-resolved frequency spectrum of a frequency agile CW laser is measured with a 300υs update rate and 3 kHz resolution/accuracy over a 28 nm wavelength range with a coherent dual comb setup.

Frequency-Dependent Charge-Pumping: The Depth Question Revisited

May 1, 2010
Author(s)
Fan Zhang, Kin P. Cheung, Jason Campbell, John S. Suehle
A popular defect depth-profiling technique, frequency-dependent charge-pumping is carefully re-examined. Without complicated math of modeling, the physics behind the technique is examined clearly. It is shown that there is no unique relationship between

Machine Learning Study of the Heulandite Family of Zeolites

May 1, 2010
Author(s)
Shujiang Yang, Mohammed Lach-hab, Estela Blaisten-Barojas, Xiang Li, Vicky L. Karen
Heulandite and clinoptilolite form the most abundant family of natural zeolite crystals. The topology of both of them is characterized by the framework type HEU. Despite many studies on these crystals, the mineral assignment to a zeolite as heulandite or

NEW DESIGNS FOR HIGH-RESISTANCE STANDARD RESISTORS

May 1, 2010
Author(s)
Andrew J. Dupree, Dean G. Jarrett
Discussed are the efforts undertaken at the National Institute of Standards and Technology to create a new set of high-resistance standards (specifically the 10 MΩ to 100 MΩ range) using newer more stable film-type resistors. The history of film-type

NEXT GENERATION GUARDED HAMON TRANSFER STANDARDS FOR HIGH RESISTANCE

May 1, 2010
Author(s)
Dean G. Jarrett, Andrew J. Dupree
Guarded Hamon transfer standards have been used at NIST for decades for scaling to high resistance levels. A recent project has been undertaken to apply improved designs in guarded Hamon transfer standards to the 1 MΩ to 100 MΩ ranges with the larger goal
Displaying 26701 - 26725 of 73697
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