Dupree, A.
and Jarrett, D.
(2010),
NEW DESIGNS FOR HIGH-RESISTANCE STANDARD RESISTORS, 2010 Conference on Precision Electromagnetic Measurements Conference Digest, Daejeon, KR, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=904825
(Accessed May 10, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
NEW DESIGNS FOR HIGH-RESISTANCE STANDARD RESISTORS
Published
Author(s)
Andrew J. Dupree,
Abstract
Discussed are the efforts undertaken at the National Institute of Standards and Technology to create a new set of high-resistance standards (specifically the 10 MΩ to 100 MΩ range) using newer more stable film-type resistors. The history of film-type resistors in high-resistance standards is briefly reviewed. Also examined are the improvements made upon similar resistance standard implementations done by the Instituto Nacional de Tecnología Industrial (INTI) in Argentina, primarily the use of a guarded, highly resistive backbone to reduce leakage currents. Promising results, including reduced settling time and improved stability, are presented.Proceedings Title
2010 Conference on Precision Electromagnetic Measurements Conference Digest
Volume
978-1-4244-6794-5/10
Conference Dates
June 13-18, 2010
Conference Location
Daejeon, KR
Conference Title
2010 Conference on Precision Electromagnetic Measurements
Pub Type
Conferences
Download Paper
Keywords
standard resistor, high resistance, leakage current, guard circuit, measurement
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created April 30, 2010, Updated October 12, 2021