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Search Publications

NIST Authors in Bold

Displaying 25826 - 25850 of 73969

Development of a Four-channel System for Johnson Noise Thermometry

December 30, 2010
Author(s)
Alessio Pollarolo, Chiharu Urano, Paul Dresselhaus, Jifeng Qu, Horst Rogalla, Samuel Benz
Long integration time is necessary to reach low uncertainty when measuring temperature through Johnson Noise Thermometry (JNT). The main goal of the NIST JNT experiment is to achieve a 6×10-6 relative uncertainty in the measurement of the water triple

Effects of Polymeric Nanogratings on Cell Orientation

December 30, 2010
Author(s)
Nancy J. Lin, Sheng Lin-Gibson, Jirun Sun, Yifu Ding
Surface topography is known to play a critical role in the biological response to materials, with surface features on the order of both microns and nanometers altering cell response, including morphology, adhesion, cytoskeletal orientation, and gene

A 10 mK Scanning Probe Microscopy Facility

December 29, 2010
Author(s)
Young J. Song, Alexander F. Otte, Steven R. Blankenship, Alan H. Band, Frank M. Hess, Young Kuk, Vladimir Shvarts, Zuyu Zhao, Joseph A. Stroscio
We describe the design, development and performance of a scanning probe microscopy (SPM) facility operating at a base temperature of 10 mK in magnetic fields up to 15 T. The microscope is cooled by a custom designed, fully ultra-high vacuum (UHV)

Guidelines for the Secure Deployment of IPv6

December 29, 2010
Author(s)
Sheila E. Frankel, Richard Graveman, John Pearce, Mark Rooks
Due to the exhaustion of IPv4 address space, and the Office of Management and Budget (OMB) mandate that U.S. federal agencies begin to use the IPv6 protocol, NIST undertook the development of a guide to help educate federal agencies about the possible

Securing WiMAX Wireless Communications

December 27, 2010
Author(s)
Shirley M. Radack
This bulletin summarizes the information presented in NIST Special Publication (SP) 800-127, Guide to Securing WiMAX Wireless Communications: Recommendations of the National Institute of Standards and Technology. The publication, which was written by Karen

A Benchmark for Best View Selection of 3D Objects

December 23, 2010
Author(s)
Helin Dutagaci, Chun Pan (Benny) Cheung, Afzal A. Godil
The best view selection corresponds to the task of automatically selecting the most representative view of a 3D model. In this paper, we describe a benchmark for evaluation of best view selection algorithms. The benchmark consists of the preferred views of

Evidence that the reversible strain effect on critical current density and flux pinning in Bi2Sr2Ca2Cu3Ox tapes is caused entirely by the pressure dependence of the critical temperature

December 23, 2010
Author(s)
Daniel C. van der Laan, J. F. Douglas, Cameron C. Clickner, Theodore C. Stauffer, Loren F. Goodrich, Hans J. van Eck
It is well known that the critical temperature of cuprate- and iron-based high-temperature superconductors changes with pressure. YBa 2Cu 3O 7-δ coated conductors, as well as Bi 2Sr 2CaCu 2O x and Bi 2Sr 2Ca 2Cu 3O x tapes and wires, show a clear

Influence of Polyethyleneimine Graftings of Multi-Walled Carbon Nanotubes on Their Accumulation and Elimination by and Toxicity to Daphnia magna

December 23, 2010
Author(s)
Elijah J. Petersen, Roger A. Pinto, Danielle J. Mai, Peter E. Landrum, Walter J. Weber
Carbon nanotubes (CNTs) are often modified for different intended applications which often changes the nanotubes’ physicochemical properties, such as surface charge. Assessing the extent to which such modifications to carbon nanotubes influence their

Superconducting multiplexer filter bank for a frequency-selective power limiter

December 23, 2010
Author(s)
Eduard Rocas, Alberto Padilla, Jordi Mateu, Juan C. Collado Gomez, James C. Booth, Juan M. O'Callaghan
This work proposes a superconducting multiplexer filter bank configuration to be used as a frequency-selective power limiter. The proposed configuration limits narrowband high power signals without degrading the signal performance in the remainder

Torsion Balance Test of Couplings to Spin

December 23, 2010
Author(s)
Blayne R. Heckel, Eric G. Adelberger, William A. Terrano, Claire E. Cramer
This article describes constraints on possible new spin-coupled interactions using a torsion pendulum with approximately 1 × 1023 polarized electrons.

High Temperature Seebeck Coefficient Metrology

December 22, 2010
Author(s)
Joshua B. Martin, Terry M. Tritt, Winnie K. Wong-Ng, Ctirad Uher
We present an overview of the challenges and practices of thermoelectric metrology at high temperature (300 K-1300 K). The Seebeck coefficient, when combined with thermal and electrical conductivity, is a useful property measurement for evaluating the

A Mathematical Model of Atmospheric Retention of Man-made CO_2 Emissions

December 21, 2010
Author(s)
Bert W. Rust
Rust and Thijsse [Proc. CSC'07 (2007) pp. 10-16], [CiSE, Vol. 10 (2008) pp. 49-59] have shown that global annual average temperature anomalies T(t) vary linearly with atmospheric CO_2 concentrations c(t). The c(t) can be related to man-made CO_2 emissions

Characterizing a Scatterfield Optical Platform for Semiconductor Metrology

December 21, 2010
Author(s)
Bryan M. Barnes, Ravikiran Attota, Richard Quintanilha, Martin Y. Sohn, Richard M. Silver
Scatterfield microscopy is the union of a high-magnification imaging platform and the angular and/or wavelength control of scatterometry at the sample surface. Scatterfield microscopy uses Köhler illumination, where each point on the source translates to a

Combined scanning probe and light scattering characterization of multi-stage self-assembly of targeted liposome-based delivery systems

December 21, 2010
Author(s)
Natalia Farkas, John A. Dagata, Chengli Yang, Antonina Rait, Kathleen Pirollo, Esther Chang
The mean size and size distribution of a targeted nanoparticle delivery system (NDS) strongly influences the intrinsic stability and functionality of this molecular complex, affects its performance as a systemic drug delivery platform, and ultimately

Scanning Probe Microscope Dimensional Metrology at NIST

December 21, 2010
Author(s)
John A. Kramar, Ronald G. Dixson, Ndubuisi G. Orji
Scanning probe microscopy (SPM) dimensional metrology efforts at the U.S. National Institute of Standards and Technology are reviewed. The main SPM instruments for realizing the International System of Units (SI) are the Molecular Measuring Machine, the
Displaying 25826 - 25850 of 73969
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