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Search Publications

NIST Authors in Bold

Displaying 2101 - 2125 of 13215

A Framework for Throughput and Stability Analysis of a DS-CDMA Network

May 17, 1999
Author(s)
Vladimir V. Marbukh, Nader Moayeri
… we consider throughput and stability of the reverse link in a cellular system, i.e., from mobiles to the base station. … IEEE Conference on Vehicular Technology … Proceedings of the 1999 Vehicular Technology Conference …

Metrics for spin-based computing

February 27, 2026
Author(s)
Advait Madhavan
… computation. This review explores key advances in integrating magnetic and spintronic elements, from … highlighting the potential of spin-based computing in next-generation technologies. …

VAST 2006 Contest - A tale of Alderwood

November 2, 2006
Author(s)
Georges Grinstein, Theresa O'Connell, Sharon J. Laskowski, Catherine Plaisant, Jean Scholtz, Mark Whiting
… annual competition. The first Visual Analytics Science and Technology (VAST) contest was held in conjunction with the 2006 IEEE Visualization Conference. … the identification of possible political shenanigans in the fictitious town of Alderwood. A synthetic data set was …

NIST Conference Papers Fiscal Year 2017, Volume 2: Communications Technology Laboratory, Information Technology Laboratory, Material Measurement Laboratory

August 22, 2019
Author(s)
Andrea M. Medina-Smith, Kathryn Miller, Karen J. Wick
… Special Publication represents the work of Communications Technology Laboratory, Information Technology Laboratory, and Material Measurement Laboratory … Papers Fiscal Year 2017, Volume 2: Communications Technology Laboratory, Information Technology Laboratory, …

RFID Technology in Forensic Evidence Management: An Assessment of Barriers, Benefits, and Costs

October 30, 2014
Author(s)
Shannan R. Williams, Melissa Taylor, Anuj Mehta, Irland Jeffrey
… agencies have increasingly used automated identification technology (AIT), such as barcoding and radio frequency … and transfer of data to track assets and people. RFID technology provides enhanced capabilities including precise … RFID Technology in Forensic Evidence Management: An Assessment of …

Pore Formation Driven by Particle Impact in Laser, Powder-blown Directed Energy Deposition

May 26, 2023
Author(s)
Edward Garboczi, Newell Moser, Samantha Webster, Kornel Ehmann, Jian Cao, Kamel Fezzaa, Tao Sun
… particle through air-cushioning. This phenomenon stands in stark contrast to currently accepted pore formation … particle diameter and velocity play an important role in vapor entrapment and demonstrate the significance of … additive manufacturing, directed energy deposition, pore formation, …

Superconductors: An Emerging Power Technology

December 31, 2004
Author(s)
John (Jack) W. Ekin
… and government researchers to implement and test this new technology in commercial settings. … Superconductors: An Emerging Power Technology …

Guide to Industrial Wireless Systems Deployments

May 21, 2018
Author(s)
Richard Candell, Mohamed T. Hany, Kang B. Lee, Yongkang Liu, Jeanne T. Quimby, Catherine A. Remley
… the wireless systems are to be deployed, then helping them in selecting, designing, deploying, and monitoring the wireless systems using existing technology in a factory. Sufficient background materials … with checklists throughout the lifecycle of wireless technology from concept and design to deployment and …

Silicon Microelectronics Programs at the National Institute of Standards and Technology - Programs, Activities, and Accomplishments

April 6, 2001
Author(s)
Stephen Knight, Joaquin (. Martinez, Barbara J. Belzer, Michele L. Buckley
… rapid improvements in productivity and in new high technology growth industries such as electronic commerce and biotechnology. The National Institute of Standards and Technology, NIST, in fulfilling its mission of strengthening … the U.S. economy, works with industry to develop and apply technology, measurements and standards; and applies …

NIST Impact on Patenting

October 31, 2016
Author(s)
Gary W. Anderson Jr.
… The National Institute of Standards and Technology’s (NIST) mission is to “promote U.S. innovation … Innovation Metrics, Economic Impact, Technology Transfer …

A Standards Roadmap for 3D Imaging in Robotic Assembly Applications

March 15, 2021
Author(s)
Kamel Saidi, Geraldine Cheok
… Advanced Manufacturing Series (NIST AMS) - 100-39 … 3D imaging, machine vision, manufacturing, perception, roadmap, robotic assembly, workshop … A Standards Roadmap for 3D Imaging in Robotic Assembly Applications …

Implementing the ISO 15746 Standard for Chemical Process Optimization

July 3, 2016
Author(s)
Guodong Shao, Peter O. Denno, Albert T. Jones, Yan Lu
… a data model that can facilitate that integration. In this paper, we demonstrate a novel method of integrating … inputs to that optimization problem, which are captured in the ISO 15746 data model, come in two forms: goals from level 3 and feedback from level 1. …

Control System Architecture for the Team Program

November 18, 1988
Author(s)
Sandor S. Szabo, Harry A. Scott, R Kilmer
… Second International Symposium on Robotics and Manufacturing Research Education and Applications … of the Second International Symposium on Robotics and Manufacturing Research Education and Applications …

Determination of the Planck constant at the National Institute of Standards and Technology

July 1, 2014
Author(s)
Stephan Schlamminger, Darine El Haddad, Frank C. Seifert, Leon S. Chao, David B. Newell, Ruimin Liu, Richard L. Steiner, Jon R. Pratt
… a watt balance at the National Institute of Standards and Technology (NIST). The value is h=6.626 069 79(30) x 10^{-34} … Planck constant at the National Institute of Standards and Technology …

Improving Biometric and Forensic Technology: The Future of Research Datasets Symposium Report

March 14, 2017
Author(s)
Shannan Williams, Melissa Taylor, Kiebuzinski George
… and 27th, 2015, the National Institute of Standards and Technology (NIST), in collaboration with the National … held a workshop entitled: Improving Biometric and Forensic Technology: The Future of Research Datasets at NIST's campus … Improving Biometric and Forensic Technology: The Future of Research Datasets Symposium Report …

Statistical Quality Control Technology in Japan--A Report for the Office of Naval Research

July 1, 1990
Author(s)
K Bowman, Ted Hopp, Raghu N. Kacker, R Lundegard
… team organized by the National Institute of Standards and Technology visited Japan to assess research and applications of statistical quality control technology. The team explored the philosophy and conduct for … Statistical Quality Control Technology in Japan--A Report for the Office of Naval Research …

Energy Distribution of Interface Traps in High-K Gated MOSFETs

June 1, 2003
Author(s)
Jin-Ping Han, Eric M. Vogel, Evgeni Gusev, C. D'Emic, Curt A. Richter, Da-Wei Heh, John S. Suehle
… density (Dit) and capture cross-section of electrons/holes in high-k HfO2 gated nMOSFETs. Our results have revealed that the Dit is much higher in the upper half of the bandgap than that in the lower half of the bandgap. These results are … 2003 Symposia on VLSI Technology and Circuits …
Displaying 2101 - 2125 of 13215
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