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Displaying 9926 - 9950 of 13225

Area Measurements of Apertures for Exo-Atmospheric Solar Irradiance for JPL

September 13, 2007
Author(s)
Maritoni A. Litorja, Bettye C. Johnson, J B. Fowler
… apertures used for total solar irradiance measurements in the Active Cavity Radiometer Irradiance Monitor II (ACRIM … conducted between the National Institute of Standards and Technology (NIST) and the Jet Propulsion Laboratory (JPL). … and the validation procedures undertaken are described in this paper. This is part of an Earth Observing System …

Workshop on the Evaluation of a Tactical Decision Aid Display

August 1, 2007
Author(s)
William D. Davis, R Vettori, Paul A. Reneke, L D. Brassell, David G. Holmberg, Jodi Kostecki, Jessica Kratchman
… On July 26, 2005, the National Institute of Standards and Technology (NIST) conducted a workshop consisting of fire … The second objective was to have the group participate in a hands-on exercise, where they were able to work with and … for improvements of the current displays are presented in this document. …

Synchrotron Radiation Based Irradiance Calibration From 200 nm to 400 nm at SURF III

January 1, 2007
Author(s)
Uwe Arp, Charles E. Gibson, Keith R. Lykke, Albert C. Parr, Robert D. Saunders, D J. Shin, Ping-Shine Shaw, Zhigang Li, Howard W. Yoon
… recently at the National Institute of Standards and Technology (NIST). The facility uses the calculable radiation … irradiance from the source under test can be determined. In particular, we discuss the calibration of deuterium lamps …

Will Future Measurement Needs for the Semiconductor Industry Be Met?

January 1, 2007
Author(s)
Herbert S. Bennett, Alain C. Diebold, C. M. Garner
… of the state of the nation''s measurement system in its ability to meet the metrology needs of the … the semiconductor industry''s powerful deflationary force in the world?s macro-economy and to maintain its exceptional …

Comparison of the NIST and BIPM Standards for Air Kerma in Medium-Energy X-Rays

October 1, 2006
Author(s)
D T. Burns, C M. O'Brien
… x-rays of the National Institute of Standards and Technology (NIST) and the Bureau International des Poids et … ionization chamber standards. Reference beam qualities in the range from 100 kV to 250 kV were used. The results show the standards to be in reasonable agreement within the combined standard …

Elimination of two level fluctuators in superconducting quantum bits by an epitaxial tunnel barrier

September 7, 2006
Author(s)
Seongshik Oh, Katarina Cicak, Jeffrey S. Kline, Mika Sillanpaa, Jed D. Whittaker, Raymond W. Simmonds, David P. Pappas, Kevin Osborn
… Quantum computing based on Josephson junction technology is considered promising due to its scalable … Al2O3 tunnel barrier. We have found an 80% reduction in the density of the spectral splittings that indicate the existence of two-level fluctators TLFs in amorphous tunnel barriers. The residual 20% TLFs can be …

NIST Measurement Services: Specular Gloss

May 15, 2006
Author(s)
Maria E. Nadal, E A. Early, E A. Thompson
… techniques used at the National Institute of Standards and Technology (NIST) to measure specular gloss. The organization … equations relevant to the measurements described in this document. The NIST reference goniophotometer … and uncertainty analysis of the instrument are described in Sec. 3. In Sec. 4 the new primary specular gloss standard …

Amendments to the Fire Protection and Life Safety Provisions of the New York City Building Code by Local Laws Adopted While World Trade Center 1, 2, and 7 Were in Use. Federal Building and Fire Safety Investigation of the World Trade Center Disaster (NIST

December 1, 2005
Author(s)
J C. Razza, R A. Grill
… and practices of the National Institute of Standards and Technology (NIST) World Trade Center (WTC) Investigation. … that WTC 1 and WTC 2 were designed and constructed in accordance with the BCNYC as enacted by Local Law No. 76 … Laws Adopted While World Trade Center 1, 2, and 7 Were in Use. Federal Building and Fire Safety Investigation of the …

Spectral Matching With an LED-Based Spectrally Tunable Light Source

August 4, 2005
Author(s)
Irena Fryc, Steven W. Brown, Yoshihiro Ohno
… and constructed at the National Institute of Standards and Technology (NIST). The source is designed to have a … spectral distribution, mimicking various light sources in the visible region by feedback control of the radiant …

Ultraviolet single-photons on demand and entanglement of photons with a large frequency difference

December 20, 2004
Author(s)
Lu Deng, Edward W. Hagley, M. G. Payne, Ying Wu
… fast developing quantum dot singlephotons on demand source technology. We show that near maximum, entanglement between … study may lead to research and development opportunities in highly efficient entanglement schemes using photons of … single-photon metrology and single-photon counting sensors in the uv spectra region. …

Micromachined Alkali Atom Vapor Cells for Chip-Scale Atomic Clocks

January 30, 2004
Author(s)
Li-Anne Liew, Svenja A. Knappe, John M. Moreland, Hugh Robinson, Leo W. Hollberg, John Kitching
… fabrication of chip-sized alkali atom vapor cells, for use in highly miniaturized atomic frequency references, using silicon micromachining and anodic bonding technology. The cells consist of silicon cavities with …

From Data to Outcomes: Assessment activities at the NIST Research Library

October 1, 2003
Author(s)
Barbara P. Silcox, P J. Deutsch
… Committee (RAC) at the National Institute of Standards and Technology (NIST) in its 2000 Annual Report to the NIST Director expressed … the research needs of the scientific and technical staff in the very near future due to inadequate and stagnant …

1/f Noise Floor of Solid-State Voltage Standards

August 1, 2003
Author(s)
Yi-hua D. Tang, Thomas J. Witt
… using the Allan variance to take into account correlation in serial measurements by specifying the limit of precision … Zener standards of the National Institute of Standards and Technology (NIST) using either a Josephson voltage standard …
Displaying 9926 - 9950 of 13225
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