1/f Noise Floor of Solid-State Voltage Standards

Published

August 1, 2003

Author(s)

Yi-hua D. Tang, Thomas J. Witt

Abstract

To characterize the performance of solid-state voltage standards (Zener standards) the 1/f nature of Zener noise must be considered. At the Bureau International des Poids et Mesures (BIPM) this is done by using the Allan variance to take into account correlation in serial measurements by specifying the limit of precision quanitified by the constant value called the 1/f noise floor taken on by the Allan variance. This paper discusses two methods to determine the noise floor of Zener standards of the National Institute of Standards and Technology (NIST) using either a Josephson voltage standard to measure a single Zener or by comparing two Zener standards. Results for two types of Zener standards are presented.

Proceedings Title

Conference Proceedings of 2003 NCSL International Workshop and Symposium

Conference Dates

August 18-22, 2003

Conference Location

Tampa, FL, USA

Conference Title

2003 NCSL International Workshop and Symposium

Pub Type

Conferences

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Keywords

power spectral density, Zener standard, 1/f noise, Allan variance, Josephson voltage standard

Citation

Tang, Y. and Witt, T. (2003), 1/f Noise Floor of Solid-State Voltage Standards, Conference Proceedings of 2003 NCSL International Workshop and Symposium, Tampa, FL, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31339 (Accessed December 15, 2024)