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NIST Authors in Bold

Displaying 9901 - 9925 of 13225

NIST 1-kilonewton sine force calibration system

January 22, 2014
Author(s)
Akobuije D. Chijioke, Ricky L. Seifarth, Zeina J. Kubarych
… applications are of a dynamic nature, and in recent decades there has been much progress in demonstrating and developing dynamic calibration systems … force transducers. The National Institute of Standards and Technology (NIST), U.S.A., is developing a system for …

Technical Guidance for Archiving and Configuration Management of Homeland Security Simulation Applications

January 15, 2014
Author(s)
Charles R. McLean, Sanjay Jain, Yung-Tsun Lee, Charles W. Hutchings
… inside and outside of DHS who may have limited expertise in simulation to better understand the technologies used to … (within the context of simulation) that are addressed in this report include: a) Archiving of simulation … software, and test data. The technical guidance contained in this report is based on published literature, information …

Production and Applications of Cellulose Nanomaterials

August 1, 2013
Author(s)
Michael T. Postek, Robert J. Moon, Alan Rudie, Michael Bilodeau
… of research being conducted worldwide on the science and technology of cellulose nanomaterials. The format of this … a level where they can be understood by non-specialists in the research fields, and with a lot of figures and … Although we have tried to be thorough and inclusive in searching out authors, the world is still a big place in …

Critical dimension metrology by through-focus scanning optical microscopy beyond the 22 nm node

June 7, 2013
Author(s)
Ravikiran Attota, Benjamin D. Bunday, Victor Vertanian
… down to features at and well below the International Technology Roadmap for Semiconductors' 22 nm node. The TSOM … such as line height, sidewall angle, width, and pitch in fins of fin-shaped field effect transistor structures using conventional optical microscopes. In addition, the method requires targets substantially …

Silicon Micromachines for Fun and Profit

December 12, 2012
Author(s)
David Bishop, Flavio Pardo, Cris Bolle, Randy Giles, Vladimir Aksyuk
… of silicon micromachines for a wide range of applications. In this article, which is part of a special volume to … applications such as a large, all-optical switch. In this article we make the point that MEMS devices and VLSI …

Nanocrystalline Zinc Oxide Powder for X-ray Diffraction Metrology

August 6, 2012
Author(s)
David R. Black, Joseph J. Ritter, John E. Bonevich, Albert Henins, James P. Cline
… thermal processing which were chosen to yield crystallites in two size ranges, one with a distribution centered at … will be used for a National Institute of Standards and Technology (NIST) Standard Reference Material (SRM) 1979, a … Advances in x-ray analysis …

Technical Guidance for Archiving and Configuration Management of Homeland Security Simulation Applications

June 19, 2012
Author(s)
Charles R. McLean, Yung-Tsun Lee, Sanjay Jain, Charles W. Hutchings
… inside and outside of DHS who may have limited expertise in simulation to better understand the technologies used to … (within the context of simulation) that are addressed in this report include: a) Archiving of simulation … software, and test data. The technical guidance contained in this report is based on published literature, information …

Synchronizing Computer Clocks Using Kalman Filters

July 31, 2011
Author(s)
Judah Levine
… operated by the National Institute of Standards and Technology (NIST) and the primary atomic clock ensemble in Boulder, which realizes UTC(NIST) and which is used as the … of multiple noise sources such as the fluctuations in the asymmetry of the channel delay and the statistical …

SP250 Spectral Irradiance Calibrations

July 25, 2011
Author(s)
Howard W. Yoon, Charles E. Gibson
… uncertainties at the National Institute of Standards and Technology. It describes the measurement procedures for the …

Size Measurement of Nanoparticles using Atomic Force Microscopy

January 1, 2011
Author(s)
Jaroslaw Grobelny, Frank W. DelRio, Pradeep Namboodiri, Doo-In Kim, Vincent A. Hackley, Robert F. Cook
… considered are National Institute of Standards and Technology (NIST) Au nanoparticle Reference Materials RM 8011 … Grobelny , Frank W. DelRio , Pradeep Namboodiri , Doo-In Kim , Vincent A. Hackley , Robert F. Cook … Methods in Molecular Medicine, Characterization of Nanoparticles …

Hydrolytic stability of polybenzobisoxazole and polyterephthalamide body armor.

May 6, 2010
Author(s)
Amanda L. Forster, Guillaume Messin, Kirk D. Rice, Pierre Pintus, Joannie W. Chin, Sylvain H. Petit
… work conducted at the National Institute of Standards and Technology (NIST) to investigate the field failures of soft … and a mechanism of this hydrolysis was proposed. In this work, viscometric estimations of the molecular weight … with another artificially degraded material commonly used in soft body armor, poly(p-phenylene terephthalamide) or …

Building and Fire Research Laboratory Activities, Accomplishments, and Recognitions, 2010

January 25, 2010
Author(s)
Kellie A. Beall, William L. Grosshandler, Sivaraj Shyam-Sunder
… BFRL is involved in a wide range of scientific, engineering, and investigative … fire safety communities. We address technical challenges in response to critical national needs, with a particular … the technical basis for standards, codes, and practices in many instances via testbeds, consortia, and/or other …

Symbol Representing Biometrics in Use

July 30, 2009
Author(s)
Yee-Yin Choong, Mary Theofanos, Brian Stanton
… During the InterNational Committee for Information Technology Standards (INCITS) M1 task group meetings in 2008, it was recognized that there is a need for a symbol … that any biometrics (fingerprint, iris, photo, etc.) are in use. The symbol is to be used to indicate that biometric …

The SIM Time Network and its Contributions to Metrology in the Americas

April 1, 2009
Author(s)
Michael A. Lombardi
… institutes (NMIs) throughout the SIM region to participate in international comparisons and to coordinate their time … provides an overview of the SIMTN, examining both the technology involved, and some of its contributions to metrology in the Americas. … The SIM Time Network and its Contributions to Metrology in the Americas …

Committee Reports of the 93rd National Conference on Weights and Measures, July 13 - 17, 2008, Burlington, Vermont (SP1080)

February 23, 2009
Author(s)
Linda D. Crown, Steven E. Cook, Lisa Warfield
… Conference on Weights and Measures (NCWM) was held in Burlington, Vermont, July 13 - 17, 2008. The theme of the … technical codes for weighing and measuring devices used in commerce, test methods, enforcement procedures, and … subjects that relate to the field of weights and measures technology. …

Comparison of Area Measurements of Apertures for Exo-Atmospheric Solar Irradiance Between NIST and JPL

October 16, 2008
Author(s)
Maritoni Litorja, B. Carol Johnson, J B. Fowler
… apertures used for total solar irradiance measurements in the Active Cavity Radiometer Irradiance Monitor II (ACRIM … conducted between the National Institute of Standards and Technology (NIST) and the Jet Propulsion Laboratory (JPL). … and the validation procedures undertaken are described in this paper. This is part of an Earth Observing System …

Magnetic Levitation System for the Dissemination of a Non-Artifact Based Kilogram

November 27, 2007
Author(s)
Zeina J. Kubarych, Patrick J. Abbott, Edwin R. Williams, Ruimin Liu, Vincent J. Lee
… uses magnetic levitation along with vacuum and balance technology to realize vacuum mass measurements. It provides … between the national standard of mass currently defined in air and the vacuum-based realizations founded on …
Displaying 9901 - 9925 of 13225
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