Nanocrystalline Zinc Oxide Powder for X-ray Diffraction Metrology

Published

August 6, 2012

Author(s)

David R. Black, Joseph J. Ritter, John E. Bonevich, Albert Henins, James P. Cline

Abstract

Nano scale zinc oxide powder has been produced using a precise thermal decomposition process from a zinc oxalate precursor powder. The size of the crystallites is determined by the specifics of the thermal processing which were chosen to yield crystallites in two size ranges, one with a distribution centered at approximately 15 nm and another centered at 70 nm. The resulting material is composed of essentially strain-free crystallites that are aggregated to a certain extent, but can nonetheless be examined with a TEM to augment X-ray diffraction analyses. This material will be used for a National Institute of Standards and Technology (NIST) Standard Reference Material (SRM) 1979, a crystallite size standard.

Proceedings Title

Advances in x-ray analysis

Conference Dates

August 6-10, 2012

Conference Location

Denver, CO

Conference Title

Denver x-ray conference

Pub Type

Conferences

Keywords

X-ray metrology, x-ray diffraction, standard reference material

Citation

Black, D. , Ritter, J. , Bonevich, J. , Henins, A. and Cline, J. (2012), Nanocrystalline Zinc Oxide Powder for X-ray Diffraction Metrology, Advances in x-ray analysis, Denver, CO (Accessed October 13, 2025)