Black, D.
, Ritter, J.
, Bonevich, J.
, Henins, A.
and Cline, J.
(2012),
Nanocrystalline Zinc Oxide Powder for X-ray Diffraction Metrology, Advances in x-ray analysis, Denver, CO
(Accessed May 1, 2025)
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Nanocrystalline Zinc Oxide Powder for X-ray Diffraction Metrology
Published
Author(s)
, , , ,
Abstract
Nano scale zinc oxide powder has been produced using a precise thermal decomposition process from a zinc oxalate precursor powder. The size of the crystallites is determined by the specifics of the thermal processing which were chosen to yield crystallites in two size ranges, one with a distribution centered at approximately 15 nm and another centered at 70 nm. The resulting material is composed of essentially strain-free crystallites that are aggregated to a certain extent, but can nonetheless be examined with a TEM to augment X-ray diffraction analyses. This material will be used for a National Institute of Standards and Technology (NIST) Standard Reference Material (SRM) 1979, a crystallite size standard.Proceedings Title
Advances in x-ray analysis
Conference Dates
August 6-10, 2012
Conference Location
Denver, CO
Conference Title
Denver x-ray conference
Pub Type
Conferences
Keywords
X-ray metrology, x-ray diffraction, standard reference material
Citation
Issues
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Created August 6, 2012, Updated February 2, 2018