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Nanocrystalline Zinc Oxide Powder for X-ray Diffraction Metrology

Published

Author(s)

David R. Black, Joseph J. Ritter, John E. Bonevich, Albert Henins, James P. Cline

Abstract

Nano scale zinc oxide powder has been produced using a precise thermal decomposition process from a zinc oxalate precursor powder. The size of the crystallites is determined by the specifics of the thermal processing which were chosen to yield crystallites in two size ranges, one with a distribution centered at approximately 15 nm and another centered at 70 nm. The resulting material is composed of essentially strain-free crystallites that are aggregated to a certain extent, but can nonetheless be examined with a TEM to augment X-ray diffraction analyses. This material will be used for a National Institute of Standards and Technology (NIST) Standard Reference Material (SRM) 1979, a crystallite size standard.
Proceedings Title
Advances in x-ray analysis
Conference Dates
August 6-10, 2012
Conference Location
Denver, CO
Conference Title
Denver x-ray conference

Keywords

X-ray metrology, x-ray diffraction, standard reference material

Citation

Black, D. , Ritter, J. , Bonevich, J. , Henins, A. and Cline, J. (2012), Nanocrystalline Zinc Oxide Powder for X-ray Diffraction Metrology, Advances in x-ray analysis, Denver, CO (Accessed July 3, 2022)
Created August 6, 2012, Updated February 2, 2018