NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Size Measurement of Nanoparticles using Atomic Force Microscopy
Published
Author(s)
Jaroslaw Grobelny, Frank W. DelRio, Pradeep Namboodiri, Doo-In Kim, Vincent A. Hackley, Robert F. Cook
Abstract
This chapter outlines procedures for sample preparation and the determination of nanoparticle size using atomic force microscopy (AFM). To start, procedures for dispersing gold nanoparticles on various surfaces such that they are suitable for imaging and height measurement via intermittent contact mode, or tapping mode, AFM are described. The methods for AFM calibration and operation to make such measurements are then discussed. Finally, the techniques for data analysis and reporting are provided. The example nanoparticles considered are National Institute of Standards and Technology (NIST) Au nanoparticle Reference Materials RM 8011 (nominally 10 nm particles), RM 8012 (nominally 30 nm), and RM 8013 (nominally 60 nm).
Citation
Methods in Molecular Medicine, Characterization of Nanoparticles Intended for Clinical Applications
Grobelny, J.
, DelRio, F.
, Namboodiri, P.
, Kim, D.
, Hackley, V.
and Cook, R.
(2011),
Size Measurement of Nanoparticles using Atomic Force Microscopy, Humana Press, Totowa, NJ
(Accessed October 10, 2025)