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NIST Authors in Bold

Displaying 2501 - 2525 of 13215

NBS Vision System in the AMRF

August 31, 1988
Author(s)
M Nashman, K Chaconas
… Group of the Robotics System Division which is used in the Automated Manufacturing Research Facility (AMRF). It discusses the objectives of the Vision System and its applications in the factory environment. Since the Vision System is a … Automated Manufacturing Research Facility, computer vision, …

Process Specification Language (PSL): Results of the First Pilot Implementation

January 1, 1999
Author(s)
Craig I. Schlenoff, Michael Gruninger, Mihai Ciocoiu, Donald E. Libes
… In all types of communication, the ability to share … it is viewed and interpreted. This is especially true in manufacturing because of the growing complexity of … (PSL) effort at the National Institute of Standards and Technology whose goal is to identify, formally define, and …

Proceedings of the Cybersecurity in Cyber-Physical Workshop, April 23 24, 2012

February 15, 2013
Author(s)
Tanya L. Brewer
… Proceedings of the Cybersecurity in Cyber-Physical Workshop,April 23 – 24, 2012, complete with … vehicles, networked medical devices, semi-conductor manufacturing, and cyber-physical testbeds. Day two of the … vehicles, networked medical devices, semi-conductor manufacturing …

NIST List of Publications LP 103, National Semiconductor Metrology Program/Semiconductor Electronics Division, 1990-1999

April 12, 2000
Author(s)
A D. Settle-Raskin
… The National Institute of Standards and Technology (NIST) began its first semiconductor metrology … projects over 40 years ago, and continues that work in close cooperation with the semiconductor industry through … including electronics and electrical engineering, manufacturing engineering, chemical science and technology, …

Mathematical Decomposition and Simulation in Real-Time Production Scheduling

January 1, 1987
Author(s)
W Davis, Albert T. Jones
… real-time production scheduling algorithm for automated manufacturing systems. Decomposition theory is used to … simulation, real-time production, scheduling, automated manufacturing … Mathematical Decomposition and Simulation in Real-Time Production Scheduling …

Experiment-based modelling of a vapor draw ampoule used for low-volatility precursors

October 22, 2019
Author(s)
Brent A. Sperling, James E. Maslar
… layer deposition processes used for microelectronics manufacturing. To aid in addressing this problem, we have recently developed an … from a commercial vapor draw ampoule. Parameters used in the model are obtained by fitting the performance of the … Journal of Vacuum Science and Technology B …

Prediction of Cement Physical Properties by Virtual Testing

September 1, 2002
Author(s)
Dale P. Bentz, C Haecker, X Feng, Paul E. Stutzman
… testing to assess the quality of their product, resulting in large costs for both materials (and their disposal) and … Testing Laboratory (VCCTL) consortium is to provide the technology to reduce the number of necessary physical tests. … measurements, highlighting the potential for this virtual technology to ultimately save the cement industry both time …

Modeling, Simulation and Prediction of Rockwell Hardness Indentation

January 1, 2001
Author(s)
Li Ma, J Zhou, Theodore V. Vorburger, R Dewit, Richard J. Fields, Samuel Low, Jun-Feng Song
… the accuracy of Rockwell hardness measurement is still in question. The indenter, including both the spheroconical … scale with metrological traceability. The difficulty in manufacturing spheoroconical diamond indenters to the … Performance Analysis of Next-Generation LADAR for Manufacturing, Construction, and Mobility …

Precision Measurements in the New Millennium: Predictions, Opportunity and Progress

January 1, 2001
Author(s)
Steven D. Phillips
… Workshop is Dimensional Metrology - Precision Measurements in the New Millennium, it is interesting to consider the pervasiveness of dimensional metrology in our industrial society. Aspects of dimensional metrology … (2) briefly examines the state and predictions for technology at the turn of the last century and (3) suggests …

Electronics and Electrical Engineering Laboratory 1998 Program Plan

January 1, 1998
Author(s)
L L. Sacchet
… and Electrical Engineering laboratory (EEEL), working in concert with other NIST Laboratories, is providing measurement capability and other generic technology critical to the competitiveness of the U.S. … the technical projects that EEEL plans to conduct in fiscal year 1998 to provide metrological support to U.S. …

Telecom band quantum dot technologies for long-distance quantum networks

December 4, 2023
Author(s)
Ying Yu, Changmin Lee, Peter Michler, Stephan Reitzenstein, Kartik Srinivasan, Edo Waks, Shunfa Liu, Jin Liu
… the low-loss optical fibre network and the established technologies of modern optical communications. Semiconductor … Telecom band quantum dot technologies for long-distance quantum networks …

Atomic Layer Deposition - Process Models and Metrologies

September 30, 2005
Author(s)
D R. Burgess, J. E. Maslar, W S. Hurst, E F. Moore, W A. Kimes, R R. Fink, Nhan Van Nguyen
… Conference on Characterization and Metrology for ULSI Technology … Characterization and Metrology for ULSI Technology: 2005 …
Displaying 2501 - 2525 of 13215
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