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Displaying 13851 - 13875 of 17285

Interoperability Testing for Shop Floor Measurement

December 28, 2007
Author(s)
Frederick M. Proctor, William G. Rippey, John A. Horst, Joseph Falco, Thomas Kramer
Manufactured parts are typically inspected to ensure quality. Inspection involves equipment and software from many different vendors, and interoperability is a major problem faced by manufacturers. The I++ Dimensional Measuring Equipment (DME)

Absolute Flux Calibrations of Stars

August 30, 2007
Author(s)
Gerald T. Fraser, Steven W. Brown, Howard W. Yoon, Bettye C. Johnson, Keith R. Lykke
… These advances include new high-temperature blackbody standards, absolute cryogenic radiometry, solid-state optical …

Open Architecture Software Design for Online Spindle Health Monitoring

May 1, 2007
Author(s)
Kang B. Lee, Robert Gao, Ruqiang Yan, Li Zhang
This paper presents open systems architecture-based software design for an online spindle health monitoring system. The software is implemented using the graphical programming language of LabVIEW, and presents the spindle health status in two types of

Particle and Photon Detection for a Neutron Radiative Decay Experiment

April 11, 2007
Author(s)
Thomas R. Gentile, Maynard S. Dewey, Hans P. Mumm, Jeffrey S. Nico, Alan K. Thompson, T E. Chupp, R Cooper, B M. Fisher, I Kremsky, F E. Wietfeldt, K G. Kiriluk, E Beise
… located at the NG-6 beam line at the National Institute of Standards and Technology Center for Neutron Research. …

A practical guide to the CIF:usability measurements

December 29, 2006
Author(s)
Mary F. Theofanos, Brian C. Stanton, Nigel Bevan
Using the Common Industry Format ( CIF) to specify usability measures can positively influence the development process. The CIF remains inherently flexible and adaptable?empowering the practitioner to identify success criteria specific to the application

Low Magnetic Moment PIN Diodes for High Field MRI Surface Coils

November 8, 2006
Author(s)
Pavel Voskoboynik, Ronald D. Joos, W E. Doherty, Ronald B. Goldfarb
Positive-intrinsic-negative (PIN) silicon diodes are commonly used in magnetic resonance imaging (MRI) coils to perform active or passive blocking and detuning, or to disable circuit functions. However, diode packages with large magnetic moments are known

Advanced Metrology Needs for Nanoelectronics Lithography

October 1, 2006
Author(s)
Stephen Knight, Ronald Dixon, Ronald L. Jones, Eric Lin, Ndubuisi G. Orji, Richard M. Silver, Andras Vladar, Wen-li Wu
… microscopy, and describe work at the National Institute of Standards and Technology advancing these tools as well as …

The evaluation of an autosomal SNP 12-plex assay

April 1, 2006
Author(s)
Peter Vallone, Amy E. Decker, Michael D. Coble, John Butler
SNPs have the potential to play a useful role in human identification testing. Small PCR amplicon sizes associated with SNP typing technologies make SNPs attractive for typing degraded DNA or other low copy number situations. SNP markers can be useful in

Improvement in the Low Energy Collection Efficiency of Si(Li) X-Ray Detectors

April 7, 2005
Author(s)
C E. Cox, Daniel A. Fischer, W G. Schwarz, Y Song
Soft X-ray beam-line applications are of fundamental importance to material research, and commonly employ high-resolution Si(Li) detectors for Energy Dispersive Spectroscopy. However, the measurement of X-rays below 1 keV compromised by absorption in the

The Structural Steel of the World Trade Center Towers

October 1, 2004
Author(s)
Frank W. Gayle, Stephen W. Banovic, Timothy J. Foecke, Richard J. Fields, William E. Luecke, Joseph D. McColskey, Thomas A. Siewert, Christopher N. McCowan
… In September 2002, the National Institute of Standards and Technology became the lead agency in an …
Displaying 13851 - 13875 of 17285
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