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NIST Authors in Bold

Displaying 13476 - 13500 of 17285

Mobile Device Forensics - Tool Testing

May 6, 2009
Author(s)
Richard Ayers
… Tool Testing (CFTT) project at the National Institute of Standards and Technology (NIST) is to establish a methodology …

CHARACTERIZATION OF LOADING EFFECTS IN PRECISION 1 Ohm RESISTORS

June 1, 2008
Author(s)
George R. Jones Jr., Randolph Elmquist
Precision standard resistors manufactured within the last two decades using improved construction techniques and materials, such as the resistance alloy Evanohm, have been shown to have excellent environmental characteristics. Power dissipation (or loading

A z-component magneto-resistive sensor

April 8, 2008
Author(s)
Fabio C. da Silva, Sean Halloran, Lu Yuan, David P. Pappas
A thin-film sensor is described that measures the component of the magnetic field perpendicular to the plane of the substrate (also called the z-component field.) The sensors are fabricated on anisotropically etched, V-shaped groves on Si(100) substrates

Wide-Bandwidth Coaxial PWB Transmission Line Probe

April 1, 2008
Author(s)
Nicholas Paulter, Robert H. Palm, Dwight D. Barry
The design, fabrication, and test of a wide bandwidth (3 dB attenuation bandwidth =>30 GHz) , 50 ohm, coaxial probe for the electrical characterization of printed wiring board (PWB) transmission lines is described. The probe can make thousands of repeated

A Model-Driven Approach for Building OWL DL and OWL Full Ontologies

October 1, 2006
Author(s)
S Brockmans, R Colomb, P Haase, E Kendall, Evan K. Wallace, G Xie
This paper presents an approach for visually modeling OWL DL and OWL Full ontologies based on the well-established visual modeling language UML. We discuss a metamodel for OWL based on the Meta-Object Facility, an associated UML profile as visual syntax

Screening Candidates for 30 nm Spheres

August 1, 2006
Author(s)
Michelle K. Donnelly, Jiann C. Yang
This paper describes the preliminary screening process that was conducted to identify potential candidate particles to be used as the NIST Standard Reference Material (SRM) 30 nm spheres. Five different samples were obtained and measured using the NIST

Blackbody radiation shift of the 27 Al + 1 S 0 - 3 P 0 transition

March 27, 2006
Author(s)
Till P. Rosenband, Wayne M. Itano, Piet Schmidt, David Hume, Jeroen Koelemeij, James C. Bergquist, David J. Wineland
… transistions under consideration for optical frequency standards. A method is presented to estimate the differntial …

Preparation of Reference Material 8504, Transformer Oil

February 1, 2006
Author(s)
Dianne L. Poster, Michele M. Schantz, Stephen A. Wise
A new reference material (RM), RM 8504, has been prepared for use as a diluent oil with Aroclors in transformer oil Standard Reference Materials (SRMs) 3075-3080 or SRM 3090 when developing and validating methods for the determination of polychlorinated

High-Bandwidth Coaxial PWB Transmission Line Probe

December 5, 2005
Author(s)
Nicholas Paulter, Robert H. Palm, Dwight D. Barry
The design and test of a wide bandwidth (3 dB attenuation bandwidth > 20 GHz) , 50 ohm , coaxial probe for the electrical characterization of printed wiring board (PWB) transmission lines is described. The probe makes thousands of repeated contacts, using

Protected Elevators and the Disabled

August 31, 2005
Author(s)
Richard W. Bukowski
… NIST is currently working with the building codes and standards community and the elevator and fire alarm …

Vapor pressures of n-heptane determined by comparative ebulliometry

July 13, 2005
Author(s)
Jesus Sanchez Ochoa, Michael B. Ewing
The vapor pressures of n-heptane have been measured using comparative ebulliometry with water as the reference substance. The measurements cover the temperature and pressure range 372 K and 102 kPa to 537 K and 2621 kPa and were correlated by a Wagner type

Unbiased Estimation of Linewidth Roughness

May 1, 2005
Author(s)
John S. Villarrubia, B Bunday
Line width roughness (LWR) is usually estimated simply as three standard deviations of the line width. The effect of image noise upon this metric includes a positive nonrandom component. The metric is therefore subject to a bias or ?systematic error? that

Sharing a Common Sense of Time

March 1, 2003
Author(s)
J C. Eidson, Kang B. Lee
Distributed measurement and control systems in which all components share a common sense of time allow significant decoupling of synchronization issues from considerations of communication latency and fluctuation. This decoupling enables new techniques for

Measuring Resin Temperature During Extrusion Using a Fluorescence Technique

January 30, 2003
Author(s)
Anthony J. Bur, S C. Roth, D W. Baugh, K A. Koppi, M A. Spalding, J Gunderson, W C. Buzanowski
We have used a temperature sensitive fluorescent dye, doped into polycarbonate, to monitor the true resin temperature during extrusion processing. The fluorescent dye, perylene, was doped into the polycarbonate at very low concentration. We apply this
Displaying 13476 - 13500 of 17285
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