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Displaying 13151 - 13175 of 17285

Reliability-Based Method for Service Life Prediction of Materials

September 17, 2003
Author(s)
Christopher C. White, Jonathan W. Martin, S F. Weber, L Shultz
Standard test methods, such as ASTM C719, evaluate sealant performance though threshold test measurements. This method and its derivatives do not offer reliable predictions of in-service performance. This presentation will detail efforts to move away from

Infrared Spectra of the Noble Gases

August 1, 2002
Author(s)
Craig J. Sansonetti, M M. Blackwell, Edward B. Saloman
… Spectroscopy Data Center of the National Institute of Standards and Technology (NIST) is currently compiling …

Comparison of Measured Optical Image Profiles of Silicon Lines with Two Different Theoretical Models

July 1, 2002
Author(s)
Richard M. Silver, Ravikiran Attota, Michael T. Stocker, Jay S. Jun, Egon Marx, Robert D. Larrabee, B Russo, M P. Davidson
In this paper we describe a new method for the separation of too-induced measurement errors and sample-induced measurement errors. We apply the method to standard overlay target configurations. This method is used to separate the effects of the tool and

Structural Ceramics Database (Version June 2001)

June 1, 2001
Author(s)
R G. Munro
An update of the NIST Standard Reference Database Number 30, the Structural Ceramics Database, has been completed. This update, designated here as Version June 2001, increases the number of reference citations from 431 to 731, and increases the number of

Combinatorial Methods at NIST

January 1, 2001
Author(s)
Alamgir Karim, Eric J. Amis
… chemistry and materials science in the Measurements and Standards Laboratory at NIST. …

Ladars for Construction Assessment and Update

January 1, 2000
Author(s)
Geraldine S. Cheok, William C. Stone, Robert R. Lipman, Christoph J. Witzgall
… Work at the National Institute of Standards and Technology (NIST) on laser radar imaging of a …

Absolute Distance Interferometry with a 670-nm External Cavity Diode Laser

October 1, 1999
Author(s)
Jack A. Stone Jr., Alois Stejskal, Lowell P. Howard
Diode lasers are becoming increasingly important in length metrology. In particular, the tunability of diode lasers makes them attractive for applications such as absolute distance interferometry (ADI). In this paper we describe the current status of our
Displaying 13151 - 13175 of 17285
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