NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Influence of Particle Oxide Coating on Light Scattering by Submicron Metal Particles on Silicon Wafers

Published

Author(s)

Jae H. Kim, S H. Ehrman, Thomas Germer

Abstract

We report the effect that room temperature oxidation has on the scattering of 633 nm light by copper particles deposited on a silicon wafer. The results provide a validation for a theory of light scattering by coated particles on a substrate and establish the lifetime of these particles as light scattering standards to be on the order of a few months. The results also suggest that the room temperature oxidation of copper particles proceeds in a continuous manner, rather than approaching an asymptotic thickness as found by Cabrera and Mott [Rep. Prog. Phys. 12, 163 (1948)] on copper films.
Citation
Applied Physics Letters
Volume
84
Issue
No 8
Pub Type
Journals

Keywords

copper, oxidation, particles, scattering, surfaces

Citation

Kim, J. , Ehrman, S. and Germer, T. (2004), Influence of Particle Oxide Coating on Light Scattering by Submicron Metal Particles on Silicon Wafers, Applied Physics Letters (Accessed October 7, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created January 31, 2004, Updated October 12, 2021
Was this page helpful?