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NIST Authors in Bold

Displaying 4151 - 4175 of 17264

Re-optimized energy levels and Ritz wavelengths of 198Hg I

May 10, 2011
Author(s)
Alexander Kramida
… I were recently compiled at the National Institute of Standards and Technology (NIST) [E. B. Saloman, J. Phys. … Ritz wavelengths that can be used as secondary wavelength standards in the wide range from 1200 Å to 65000 Å. …

A New NIST Mitochondrial DNA Interactive Website

August 1, 2002
Author(s)
Barbara C. Levin, L A. Tully, Diane K. Hancock, Frederick P. Schwarz, M S. Lee
… (SRM 2392) is now available from the National Institute of Standards and Technology to provide quality control when …

EXPERIMENTS TO PROVIDE THE SCIENTIFIC-BASIS FOR LABORATORY STANDARD TEST METHODS FOR FIREBRAND EXPOSURE

June 12, 2017
Author(s)
Samuel L. Manzello, Sayaka Suzuki
… structures is a major factor in WUI and urban fire spread. Standard laboratory test methods are lacking to evaluate and … of building component mock-ups that can be used in standard laboratory test methods. As wind is required to … EXPERIMENTS TO PROVIDE THE SCIENTIFIC-BASIS FOR LABORATORY STANDARD TEST METHODS FOR FIREBRAND EXPOSURE …

Investigating the factors that influence 3D stereo depth sensor noise

April 18, 2025
Author(s)
Terrence Pierce, Prem Rachakonda
… output is needed to characterize them and to develop standards. As machine learning (ML) with 3D point clouds and … that could be advised for specific applications and future standards addressing these sensors. … Stereoscopic Depth, Sensor Noise, 3D Sensing, Standards, Metrology …

Lumped 50 Ohm Arrays of SNS Josephson Junctions

December 1, 2006
Author(s)
Nicolas Hadacek, Paul Dresselhaus, Samuel Benz
… and to optimize their performance for Josephson voltage standards. Traditional Josephson arrays for voltage standards have used distributed microwave structures, where …

Comparison of line width calibration using critical dimension atomic force microscopes between PTB and NIST

April 19, 2017
Author(s)
Gaoliang Dai, Kai Hahm, Harald Bosse, Ronald G. Dixson
… (PTB) in Germany and the National Institute of Standards and Technology (NIST) in the United States. … scanner was calibrated by a set of step height and lateral standards certified by metrological AFMs, while the effective … Dimension, linewidth, metrology, CD-AFM, tip calibration, standards, traceability, international comparison …

Trustworthy Email

February 25, 2019
Author(s)
Scott W. Rose, J. S. Nightingale, Simson Garfinkel, Ramaswamy Chandramouli
… Special Publication (NIST SP) - 800-177 Rev. 1 …
Displaying 4151 - 4175 of 17264
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