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NIST Authors in Bold

Displaying 2426 - 2450 of 4212

IEEE TC-10: Update 2011

July 1, 2011
Author(s)
Nicholas G. Paulter Jr., Thomas E. Linnenbrink, W. B. Boyer, S. J. Tilden, Travis Ellis
There is a world-wide need to standardize terms, test methods, and the computation of performance parameters for devices that generate, measure, and analyze waveforms. Users need to be able to unambiguously specify the device performance required for

QOD Standalone Users Guide

December 16, 2009
Author(s)
Julien C. Cuvillier, Katherine C. Morris
… tools produced by NIST's XML Testbed project within the Manufacturing Systems Integration Division at NIST. These … quality XML schemas using a standards-based approach to manufacturing systems integration. QOD may be used by an XML …

IEEE TC-10: Update 2008

September 22, 2008
Author(s)
Nicholas G. Paulter Jr., Thomas E. Linnenbrink, W. B. Boyer, Robert Graham, S. J. Tilden
There is a world-wide need to standardize terms, test methods, and the computation of performance parameters for devices that generate, measure, and analyze waveforms. Users need to be able to unambiguously specify the device performance required for

Overlay Metrology: Recent Advances and Future Solutions

January 1, 2001
Author(s)
Richard M. Silver, Jay S. Jun, S Fox, Edward A. Kornegay
… levels become increasingly important. Improved manufacturing control over level to level registration has a … maintain the historic pace of increasing device speeds and manufacturing economies of scale. The projected, required 3s …

Managing Digital Libraries for Computer-Aided Design

October 1, 2000
Author(s)
William Regli, V Cicirello
… and process archival for distributed design and manufacturing teams. CAD knowledge-bases are vital to … particular, we focus on archival and reuse of design and manufacturing data for mechatronic systems. This paper …

A New Fabrication Process for Planar Thin-Film Multijunction Thermal Converters

May 1, 2000
Author(s)
Thomas F. Wunsch, Joseph R. Kinard Jr., Ronald R. Manginell, O. M. Solomon, Thomas E. Lipe Jr.
Advanced thin flm processing and packaging technologies are employed in the fabrication of new planar thin-film multijunction thermal converters. The processing packaging, and design features build on experience gained from prior NIST demonstrations of

The International Standard of Length

January 1, 1994
Author(s)
Dennis A. Swyt
This chapter discusses the modern concept of traceability as it applies to CMM measurements of manufactured parts. It shows the means by which those dimensional measurements are functionally related to the international standard of length, the various

Mass Flow Research and Standards: NIST Workshop Results

July 1, 2001
Author(s)
Robert F. Berg, David S. Green, G E. Mattingly
A recent workshop at the National Institute of Standards and Technology (NIST) identified research and standards that will benefit users and manufacturers of mass flow controllers and related equipment. The workshop identified problems with flow
Displaying 2426 - 2450 of 4212
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