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Displaying 4051 - 4075 of 4212

Fourier Instrumentation for Radiation Thermometry

October 16, 2008
Author(s)
F J. Dunmore
A miniature Fourier transform spectrometer (MFTS) has been tested as a device for remotely measuring the temperature of a high-stability/emissivity blackbody. The commercially manufactured device is based on the novel design of a polarizing Wollaston prism

High throughput adhesion testing using a modified edge lift-off test

February 17, 2008
Author(s)
Jiong Liu, Martin Chiang, Michael J. Fasolka, Christopher Stafford
The strength of an adhesively bonded joint depends on a host of factors such as surface treatment, roughness, materials properties, cure conditions and environmental variables. Therefore testing of adhesion within this large parameter space can be very

Anomalous Behavior of Teflon-Based Helium Permeation Flow Standards

June 1, 2007
Author(s)
Patrick J. Abbott, Justin H. Chow
Helium leak testing is a vital step in assuring product reliability for anything that must be packaged in a sealed container. Examples abound from blister packaging for pharmaceuticals to aluminum wheel rims for automobiles. In order to quantify detected

Compact Anamorphic Imaging Spectrometer

February 9, 2007
Author(s)
P Maciejewski, K Barnard, Rand Swanson, Michael Kehoe, C Smith, Thomas Moon, Robert R. Bousquet, Steven W. Brown, Keith R. Lykke
Deployment of compact hyperspectral imaging sensors on small UAVs has the potential of providing a cost-effective solution for rapid-response target detection and cueing based on time-critical spectral information collected at low altitudes. To address

Weights and Measures in the United States

April 11, 2006
Author(s)
Carol T. Hockert
… weights and measures system in areas such as enforcement, manufacturing, and industry, in order to establish and modify …

Display Metrology Concerns International Standards

May 11, 2005
Author(s)
Paul A. Boynton
An alphabet soup of display standards addresses the various needs and applications of display manufactures, integrators, and users. Unfortunately, when it comes to display metrology, many of these standards suffer. Assumptions are made about the

Toward Traceability for At-line AFM Dimensional Metrology

July 1, 2003
Author(s)
Marylyn H. Bennett, Angela Guerry, Ronald G. Dixson, Michael T. Postek, Theodore V. Vorburger
… for critical dimension (CD) metrology in semiconductor manufacturing are technologically advanced instruments that …

Toward Traceability for At Line AFM Dimensional Metrology

January 1, 2002
Author(s)
Ronald G. Dixson, Angela Guerry, Marylyn H. Bennett, Theodore V. Vorburger, Michael T. Postek
… for critical dimension (CD) metrology in semiconductor manufacturing are technologically advanced instruments that …

Volume 4, The 1997 Prelaunch Radiometric Calibration of Sea WiFS

April 1, 1999
Author(s)
Bettye C. Johnson, Howard W. Yoon, Sally S. Bruce, Ping-Shine Shaw, E A. Thompson, S B. Hooker, R Eplee, R Barnes, S Maritorena, J Mueller
The Sea-viewing Side Field-of-view Sensor (SeaWiFS) was originally calibrated by the instrument's manufacturer, Santa Barbara Research Center (SBRC), in November 1993. In preparation for an August 1997 launch, the Sea WiFS Project and the National

Corrigendum to: "In situ absorption synchrotron measurements, predictive modeling, microstructural analysis, and scanning probe measurements of laser melted Ti-6Al-4V single tracks for additive manufacturing applications" Journal of Alloys and Compounds 9

October 25, 2022
Author(s)
Nicholas Derimow, Edwin Schwalbach, Jake Benzing, Jason Killgore, Aly Artusio-Glimpse, Nik Hrabe, Brian Simonds
… of laser melted Ti-6Al-4V single tracks for additive manufacturing applications" Journal of Alloys and Compounds 9 …
Displaying 4051 - 4075 of 4212
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