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Search Publications

NIST Authors in Bold

Displaying 3351 - 3375 of 4212

Methods for Performance Evaluation of Single Axis Positioning Systems: A New Standard

October 25, 2013
Author(s)
Ronnie R. Fesperman Jr., Nathan Brown, Kevin Elliott, Jonathan D. Ellis, Axel Grabowski, Steve Ludwick, Serge Maneuf, Brian O'Connor, Shane Woody
Many new high-precision linear and angular positioning systems are being used in emerging micro- and nanotechnology applications. Measuring and certifying the performance of these systems with off-the-shelf instrumentation and test methods suggested by

Two Applications of Small Feature Dimensional Measurements on a CMM with a Fiber Probe

September 4, 2013
Author(s)
Eric S. Stanfield, Bala Muralikrishnan, Theodore D. Doiron, Xiaoyu Alan Zheng, Shahram Orandi, david Duquette
We describe two interesting applications of dimensional measurements performed using a contact fiber probe on a commercial Coordinate Measuring Machine (CMM). Both examples involve artifacts that serve as material standards and contain features in the 100

The Forthcoming IEEE Standard 1696 on Test Methods for Characterizing Circuit Probes

May 6, 2013
Author(s)
Nicholas Paulter, John Jendzurski, Mike McTigue, Bill Hagerup, Thomas E. Linnenbrink
The Technical Committee 10 (TC10) of the IEEE Instrumentation and Measurement Society initiated a new standards activity in 2006 for the development of test methods to characterize the performance of circuit probes. This standard contains a set of

Emergency Response Robot Evaluation Exercise

March 22, 2012
Author(s)
Adam S. Jacoff, Hui-Min Huang, Ann Virts, Anthony Downs, Raymond Sheh
More than 60 robot test methods are being developed by a team lead by the National Institute of Standards and Technology (NIST) with the sponsorship of U.S. Department of Homeland Security (DHS). These test methods are being specified and standardized

Development of the Metrology and Imaging of Cellulose Nanocrystals

September 19, 2011
Author(s)
Michael T. Postek, Andras Vladar, John A. Dagata, Natalia Farkas, Bin Ming, Ryan Wagner, Arvind Raman, Robert J. Moon, Ronald Sabo, Theodore H. Wegner, James Beecher
… commercialization requires the development of efficient manufacturing processes and nanometrology to monitor quality. …

TSOM Method for Semiconductor Metrology

April 18, 2011
Author(s)
Ravikiran Attota, Ronald G. Dixson, John A. Kramar, James E. Potzick, Andras Vladar, Benjamin D. Bunday, Erik Novak, Andrew C. Rudack
… potentially significant savings and yield improvements in manufacturing. …

New approach to calibrate the mortar flow table

January 27, 2011
Author(s)
Chiara F. Ferraris, Haleh Azari
The flow table is a standardized test that is widely used to qualify a mortar to be tested for compressive strength and air content. It is also the only standard test to quantify a mortar workability property. Therefore, the calibration of this device is

Progress Toward Corrugated Feed Horn Arrays in Silicon

December 16, 2009
Author(s)
Joseph W. Britton, Ki W. Yoon, James A. Beall, Daniel T. Becker, Hsiao-Mei Cho, Gene C. Hilton, Michael D. Niemack, Kent D. Irwin
We are developing monolithic arrays of corrugated feed horns fabricated in silicon for dual-polarization single mode operation at 90, 145 and 220 GHz. The arrays consist of hundreds of platelet feed horns assembled from gold coated stacks of micromachined

Semiconducting Thienothiophene Copolymers: Design, Synthesis, Morphology and Performance in Thin Film Organic Transistors

March 1, 2009
Author(s)
Iain McCulloch, Martin Heeney, Michael L. Chabinyc, Dean DeLongchamp, Regis J. Kline, Michael Colle, Warren Duffy, Daniel A. Fischer, David J. Gundlach, Behrang Hamadani, Rick Hamilton, Lee J. Richter, Alberto Salleo, Martin Shkunov, David Sparrowe, Steve Tierney, Weimin Zhang
Organic semiconductors are emerging as a viable alternative to amorphous silicon in a range of thin film transistor devices. , With the possibility to formulate these p-type materials as inks and subsequently print into patterned devices, organic based

NEW PRACTICAL METHOD FOR MEASUREMENT OF HIGH-POWER LEDS

October 1, 2008
Author(s)
Yuqin Zong, Yoshihiro Ohno
The measurement of high-power light emitting diodes (LEDs) has been difficult because they are highly sensitive to thermal operating conditions, and there has been a lack of common methods that can be used by both LED manufactures and users to acquire

Microfluidic DNA Analysis Systems for Forensic Applications

July 18, 2008
Author(s)
Michael Gaitan, Jayna J. Shah, Darwin Reyes-Hernandez, Pierre-Alain Auroux, Jon Geist, Laurie E. Locascio, Wyatt N. Vreeland, David J. Ross, Peter Vallone, Paul Smith, Nicole Morgan, Tom Pohida, John Kakareka, Annelise Barron
… required, and reduce contamination. This will enable manufacturing methods and measurement protocols that can be …
Displaying 3351 - 3375 of 4212
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