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Displaying 3076 - 3100 of 4199

Converting System Failure Histories Into Future Win Situations

January 7, 2000
Author(s)
D Wallace, David R. Kuhn
Most complex systems today contain software, and systems failures activated by software faults can provide lessons for software development practices and software quality assurance. This paper presents an analysis of software-related failures of medical

Software Quality Lessons From Medical Device Failure Data

November 1, 1999
Author(s)
D Wallace, David R. Kuhn
Most complex systems today contain software, and systems failures activated by software faults can provide lessons for software development practices and software quality assurance. This report presents an analysis of 342 software-related failures of

Heat Release Rate: The Single Most Important Variable in Fire Hazard

October 20, 1990
Author(s)
Vyto Babrauskas, Richard Peacock
Heat release rate measurements are sometimes seen by manufacturers and product users as just another piece of data to gather. It is the purpose of this paper to explain why heat release rate is in fact, the single most important variable in characterizing

NIST Express Working Form Programmer

April 1, 1990
Author(s)
Steve Clark
… for the exchange of product information among various manufacturing applications. PDES includes an information …

Common Memory for the Personal Computer

January 1, 1988
Author(s)
Siefried Rybczynski
… of the common memory architecture defined by the Automated Manufacturing Research Facility (AMRF) of the National Bureau …

Next-Generation Chip-Scale Atomic Clocks

October 16, 2023
Author(s)
John Kitching, Matthew Hummon, William McGehee, Ying-Ju Wang, Susan Schima
We describe work toward the development of next-generation chip-scale atomic clocks, which combine small size, low power consumption and manufacturability with high frequency stability. The use of optical transitions in microfabricated vapor cells improves

Smart Home Device Loss of Support: Consumer Perspectives and Preferences

July 23, 2023
Author(s)
Julie Haney, Susanne M. Furman
Unsupported smart home devices can pose serious safety and security issues for consumers. However, unpatched and vulnerable devices may remain connected because consumers may not be alerted that their devices are no longer supported or do not understand

A Reference Modulated Scatterer for ISO18000-6 UHF Tag Testing

November 15, 2012
Author(s)
David R. Novotny, Daniel G. Kuester, Jeffrey R. Guerrieri
We present a method for measuring Ultra-High Frequency Radio-Frequency Identification (UHF RFID) tag differential RCS that has the potential for being easier and more accurate than current and proposed methods [1-2]. This method is based on accurately

Calibration of Laminar Flow Meters for Process Gases

June 1, 2012
Author(s)
John D. Wright, Thiago Cobu, Robert F. Berg, Michael R. Moldover
We calibrated three models of commercially-manufactured, laminar flow meters (LFMs) at four pressures (100 kPa, 200 kPa, 300 kPa, and 400 kPa) with five gases (N2, Ar, He, CO2, and SF6) over a 10:1 flow range using NIST’s primary flow standards as

A New Electronic Verification Method for Vector Network Analyzers

June 13, 2010
Author(s)
Ronald A. Ginley, Dylan F. Williams, Denis X. LeGolvan
The National Institute of Standards and Technology (NIST) has recently introduced a new method for the verification of Vector Network Analyzers (VNAs). The technique is based on the new electronic calibration units that are available from several

An Automated Ionization Chamber for Secondary Radioactivity Standards

December 8, 2009
Author(s)
Ryan P. Fitzgerald
We report on the operation and characterization of a new ionization chamber system, called AUTOIC, featuring a commerical digital electrometer and a commerical robotic sample changer. The ralative accuracy of the electrometer was improved significantly
Displaying 3076 - 3100 of 4199
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