July 30, 2006
Author(s)
John G. Gillen, J Batteas, Chris A. Michaels, P Chi, John A. Small, Eric S. Windsor, Albert J. Fahey, Jennifer R. Verkouteren, W Kim
… A C60+ primary ion source has been coupled to an ion microscope SIMS instrument to examine sputtering of … also observed on silicon substrates after high primary ion dose C60+ bombardment. … cluster bombardment, depth profiling, fullerene, ion source, secondary ion mass spectrometry …