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Displaying 6501 - 6525 of 7113

Assessment of measurement uncertainty via observation equations

December 3, 2007
Author(s)
Antonio M. Possolo, Blaza Toman
According to the Guide to the Expression of Uncertainty in Measurement, measurement uncertainty is assessed by computational propagation of error based on a measurement equation that expresses the measurand as a known function of input variables. However

An Empirical Study of Sample Size in ROC-Curve Analysis of Fingerprint Data

December 4, 2006
Author(s)
Jin Chu Wu, Charles Wilson
The fingerprint datasets in many cases may exceed millions of samples. Thus, the needed size of a biometric evaluation test sample is an important issue in terms of both accuracy and efficiency. In this article, an empirical study, namely, using Chebyshev

Cement Hydration: Building Bridges and Dams at the Microstructure Level

July 12, 2006
Author(s)
Dale P. Bentz
The concurrent goals of cement hydration are to percolate (bridge) the original cement particles into a load-bearing network and to depercolate (dam) the original water-filled capillary porosity. The initial volume, particle size distribution, and

Evaluation of Color Difference Formulae for Color Rendering Metrics

May 20, 2006
Author(s)
Wendy L. Davis, Yoshihiro Ohno
Solid-state lighting is providing strong incentive to develop a new color rendering or color quality metric for sources of general illumination. Differences in perceived color between reflective samples illuminated by the test lamp and a reference source

The Role of Standards in Product Lifecycle Management Support

January 1, 2006
Author(s)
Eswaran Subrahmanian, Sudarsan Rachuri, A Bouras, Steven J. Fenves, Sebti Foufou, Ram D. Sriram
A major challenge of any product engineering project is to support the creation, exchange, management and archival of information about product, process, people and services across the networked and extended enterprise covering the entire product lifecycle

Creation of a six-atom Schrodinger cat state

December 1, 2005
Author(s)
Dietrich G. Leibfried, Emanuel H. Knill, Signe Seidelin, Joseph W. Britton, Brad R. Blakestad, J Chiaverini, David Hume, Wayne M. Itano, John D. Jost, C. Langer, R Ozeri, Rainer Reichle, David J. Wineland
… They are a fundamental resource in fault-tolerant quantum computing and quantum communication, where they can enable …

Optimization of Polymer Concrete Composites: Final Report

August 1, 1999
Author(s)
L Czarnecki, A Garbacz, P Lukowski, J R. Clifton
The main aim of the study was the development of a method for the design and optimization of polymer concrete composites, using a fundamental approach based on a material model of polymer concrete. The polymer concrete materials were characterized via

Telepresence: A New Paradigm for Industrial and Scientific Collaboration

June 1, 1999
Author(s)
Michael T. Postek, Marylyn H. Bennett, N J. Zaluzec
A portion of the mission of the National Institute of Standards and Technology (NIST) Manufacturing Engineering Laboratory (MEL) is to improve and advance length metrology in aid of U.S. industry. The successful development of a Collaboratory for

NIST Calibration Facility for Display Colorimeters

April 12, 1999
Author(s)
Steven W. Brown, Yoshihiro Ohno
A calibration facility has been developed at the National Institute of Standards and Technology (NIST) to address the need for high accuracy color measurementsof displays. Calibration services tailored to display measuremets are planned for colimeters and

Critical Compilation of Atomic Wavelength and Energy Level Data

April 1, 1998
Author(s)
William C. Martin, J Sugar, Arlene Musgrove, Craig J. Sansonetti, Jean E. Sansonetti, Edward B. Saloman, V I. Azarov, Alexander Kramida, A N. Ryabtsev, T Shirai
The Atomic Energy Levels Data Center at the National Institute of Standards and Technology (NIST), in cooperation with other laboratories indicated above, is critically evaluating and compiling energy levels, wavelengths, and energy level classifications

Calibration of Scanning Electron Microscope Magnification Standards SRM-484

May 1, 1996
Author(s)
Joseph Fu, Theodore V. Vorburger, D Ballard
Standard Reference Material (SRM) 484 is an artifact for calibrating the magnification scale of a scanning electron microscope. Since 1977 the National Institute of Standards and Technology (NIST) has produced seven issues of SRM484 amounting to

Expert Control System Shell Version 1.0 User

January 1, 1995
Author(s)
Steve Osella
The Expert Control System Shell (ECSS)is a software program running on a Macintosh computer which permits the rapid prototyping of control system architectures and strategies. The ECSS consists of a user interface development tool, a rule-based expert

Interactive Process Planning in the AMRF

October 1, 1986
Author(s)
Peter Brown, Charles R. McLean
In designing a process planning system for the AMRF, the primary issue was not whether the system process, from specification through production, and retaining the information generated for later analysis or reuse. The objective of CIM is to improve the

Privacy-enhancing cryptography to complement differential privacy

November 3, 2021
Author(s)
Luis Brandao, Rene Peralta
In this post, we illustrate how various techniques from privacy-enhancing cryptography, coupled with differential privacy protection, can be used to protect data privacy while enabling data utility. Of notable interest is the setting where there are
Displaying 6501 - 6525 of 7113
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