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NIST Authors in Bold

Displaying 4326 - 4350 of 7112

Kinetic Simulations of Crystal Growth With (Nearly) Realistic Physics

October 16, 2008
Author(s)
J L. Blue
Many kinetic Monte Carlo simulations of expitaxial crystal growth have been done using a simple cubic crystal structure and over-simplified physics. We discuss how to improve these simulations in a general-purpose computer program that can handle correct

Quantum Control, Quantum Information Processing, and Quantum-Limited Metrology With Trapped Ions

June 19, 2005
Author(s)
David J. Wineland, Dietrich G. Leibfried, Murray D. Barrett, A. Ben-Kish, James C. Bergquist, Brad R. Blakestad, John J. Bollinger, Joseph W. Britton, J Chiaverini, B. L. DeMarco, David Hume, Wayne M. Itano, M J. Jensen, John D. Jost, Emanuel H. Knill, Jeroen Koelemeij, C. Langer, Windell Oskay, R Ozeri, Rainer Reichle, Till P. Rosenband, Tobias Schaetz, Piet Schmidt, Signe Seidelin
… has been to increase our capabilities in terms of quantum computing protocols, but we have also been interested in …

Information Model for Machine Tool Performance Tests

November 1, 2000
Author(s)
Yung-Tsun T. Lee, M A. Donmez, Johannes A. Soons
This report specifies an information model of machine tool performance evaluation tests. The information model provides a mechanism capable of describing the properties and results of machine tool performance tests. The objective of the information model

Calibrated Thermal Microscopy of the Tool-Chip Interface in Machining

August 1, 2000
Author(s)
Howard W. Yoon, Matthew A. Davies, Timothy J. Burns, Michael Kennedy
A critical parameter in predicting tool wear during machining and in accurate computer simulations of machining is the spatially-resolved temperature at the tool-chip interface. We describe the development and the calibration of a nearly diffraction

Calibrated Thermal Microscopy of the Tool-Chip Interface in Machining

April 1, 2000
Author(s)
Michael Kennedy, Matthew A. Davies, Howard W. Yoon, Timothy J. Burns
A critical parameter in predicting tool wear during machining and in accurate computer simulations of machining is the spatially-resolved temperature at the tool-chip interface. We describe the development and the calibration of a nearly diffraction

Modeling Grain Boundaries Using a Phase-Field Technique

January 1, 2000
Author(s)
James A. Warren, R Kobayashi, W Carter
We propose a two dimensional phase field model or grain boundary dynamics. One dimensional analytical solutions for a stable grain boundary in a bicrystal are obtained, and equilibrium energies are computed. By comparison with microscopic models of

How to Configure Linux for ATM Networks

February 22, 1999
Author(s)
Wayne J. Salamon
This article describes how to configure a personal computer (PC) running the Linux operating system, and an ATM switch, to build an ATM network. Information is given on obtaining the ATM software for Linux, and how to configure the software and the PC to

SEM Image Sharpness Analysis

January 1, 1996
Author(s)
Michael T. Postek, Andras Vladar
The technique described here, utilizing the sharpness concept, is facilitated by the use of the FFT techniques to analyze the electron micrograph to obtain the evaluation. This is not the first application of Fourier techniques to SEM images, but it is the

Demonstration of a Fundamental Universal Quantum Logic Gate

January 1, 1995
Author(s)
C Monroe, D M. Meekhof, B E. King, Wayne M. Itano, David J. Wineland
We demonstrate the operation of a two-bit "controlled-NOT" quantum logic gate, which, in conjunction with simple single-bit operations, forms a universal quantum logic gate for quantum computation. The two quantum bits are stored in the internal and

Contour-to-Grid Interpolation with Nonlinear Finite Elements: A Feasibility Study

September 1, 1987
Author(s)
Betty Mandel, Javier Bernal, Christoph J. Witzgall
The U.S. Army Engineer Topographic Laboratories and the National Bureau of Standards investigated the computational feasibility of developing a contour-to-grid algorithm by: (l) sampling a large set of digitized cartographic contour data with a tolerance

An Overarching Quality Evaluation Framework for Additive Manufacturing Digital Twin

September 2, 2024
Author(s)
Yan Lu, Zhuo Yang, Shengyen Li, Yaoyao Fiona Zhao, Jiarui Xie, Mutahar Safdar, Hyunwoong Ko
The key differentiation of digital twins from existing models-based engineering approaches lies in the continuous synchronization between physical and virtual twins through data exchange. The success of digital twins, whether operated automatically or with

Programmable electrical coupling between stochastic magnetic tunnel junctions

March 29, 2024
Author(s)
Sidra Gibeault, Temitayo Adeyeye, Liam Pocher, Daniel Lathrop, Matthew Daniels, Mark Stiles, Jabez J. McClelland, William Borders, Jason Ryan, Philippe Talatchian, Ursula Ebels, Advait Madhavan
… energy efficient implementations of various probabilistic computing techniques. When augmented with electronic … $p$-bits. Though many proposals of scalable probabilistic computing methods have been recently proposed, practical …

Assessment of Dose Reduction Strategies in Wavelength-Selective Neutron Tomography

July 31, 2023
Author(s)
Daniel Hussey, Peter Bajcsy, Paul A. Kienzle, Jacob LaManna, David Jacobson, Victoria DiStefano, Daniel Pelt, James Sethian
The goal of this study is to determine variable relationships and a computational workflow that yield the highest quality of three-dimensional reconstructions in neutron imaging applications with reduced number of projections angles. Neutrons interact with

Multiplatform Standards and Guidelines Publishing at NIST

May 20, 2021
Author(s)
Kathryn Miller
The National Institute of Standards and Technology is a nonregulatory agency of the U.S. Department of Commerce. One of the agency's responsibilities is to develop industry standards and guidelines, which are published as NIST Technical Series publications

Upper Bounds on the Multiplicative Complexity of Symmetric Boolean Functions

August 17, 2019
Author(s)
Luis Brandao, Cagdas Calik, Meltem Sonmez Turan, Rene Peralta
A special metric of interest about Boolean functions is multiplicative complexity (MC): the minimum number of AND gates sufficient to implement a function with a Boolean circuit over the basis XOR, AND, NOT}. In this paper we study the MC of symmetric
Displaying 4326 - 4350 of 7112
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