Yoon, H.
, Davies, M.
, Burns, T.
and Kennedy, M.
(2000),
Calibrated Thermal Microscopy of the Tool-Chip Interface in Machining, Thermosense XXII | XXII | | Marcel Dekker Inc.
(Accessed October 27, 2025)
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Calibrated Thermal Microscopy of the Tool-Chip Interface in Machining
Published
Author(s)
, , ,
Abstract
A critical parameter in predicting tool wear during machining and in accurate computer simulations of machining is the spatially-resolved temperature at the tool-chip interface. We describe the development and the calibration of a nearly diffraction-limited thermal-imaging microscope to measure the spatially-resolved temperatures during the machining of an AISI 1045 steel with a tungsten-carbide tool bit. The microscope has a target area of 0.5 mm x 0.5 mm square region with aProceedings Title
Thermosense XXII | XXII | | Marcel Dekker Inc.
Volume
4020
Conference Dates
April 25-27, 2000
Conference Title
Proceedings of SPIE--the International Society for Optical Engineering
Pub Type
Conferences
Keywords
calibration, machining, microscopy, thermal imaging, tool-chip interface
Citation
Issues
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Created August 1, 2000, Updated February 17, 2017