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Calibrated Thermal Microscopy of the Tool-Chip Interface in Machining



Howard W. Yoon, Matthew A. Davies, Timothy J. Burns, Michael Kennedy


A critical parameter in predicting tool wear during machining and in accurate computer simulations of machining is the spatially-resolved temperature at the tool-chip interface. We describe the development and the calibration of a nearly diffraction-limited thermal-imaging microscope to measure the spatially-resolved temperatures during the machining of an AISI 1045 steel with a tungsten-carbide tool bit. The microscope has a target area of 0.5 mm x 0.5 mm square region with a
Proceedings Title
Thermosense XXII | XXII | | Marcel Dekker Inc.
Conference Dates
April 25-27, 2000
Conference Title
Proceedings of SPIE--the International Society for Optical Engineering


calibration, machining, microscopy, thermal imaging, tool-chip interface


Yoon, H. , Davies, M. , Burns, T. and Kennedy, M. (2000), Calibrated Thermal Microscopy of the Tool-Chip Interface in Machining, Thermosense XXII | XXII | | Marcel Dekker Inc. (Accessed November 30, 2023)
Created August 1, 2000, Updated February 17, 2017