Quantum Control, Quantum Information Processing, and Quantum-Limited Metrology With Trapped Ions

Published

June 19, 2005

Author(s)

David J. Wineland, Dietrich G. Leibfried, Murray D. Barrett, A. Ben-Kish, James C. Bergquist, Brad R. Blakestad, John J. Bollinger, Joseph W. Britton, J Chiaverini, B. L. DeMarco, David Hume, Wayne M. Itano, M J. Jensen, John D. Jost, Emanuel H. Knill, Jeroen Koelemeij, C. Langer, Windell Oskay, R Ozeri, Rainer Reichle, Till P. Rosenband, Tobias Schaetz, Piet Schmidt, Signe Seidelin

Abstract

We briefly discuss recent experiments on quantum informaiton processing using trapped ions at NIST. A central theme of this work has been to increase our capabilities in terms of quantum computing protocols, but we have also been interested in applying the same concepts to improved metrology, particularly in the area of frequency standards and atomic clocks. Such work may eventually shed light on more fundamental issues, such as the quantum measurement problem.

Proceedings Title

Proc. ICOLS Conf.

Conference Location

Aviemore, SC

Pub Type

Conferences

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Keywords

atom trapping and cooling, quantum control, quantum information processing, quantum-state engineering, trapped ions

Citation

Wineland, D. , Leibfried, D. , Barrett, M. , Ben-Kish, A. , Bergquist, J. , Blakestad, B. , Bollinger, J. , Britton, J. , Chiaverini, J. , DeMarco, B. , Hume, D. , Itano, W. , Jensen, M. , Jost, J. , Knill, E. , Koelemeij, J. , Langer, C. , Oskay, W. , Ozeri, R. , Reichle, R. , Rosenband, T. , Schaetz, T. , Schmidt, P. and Seidelin, S. (2005), Quantum Control, Quantum Information Processing, and Quantum-Limited Metrology With Trapped Ions, Proc. ICOLS Conf., Aviemore, SC, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=50189 (Accessed April 18, 2024)