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Search Publications

NIST Authors in Bold

Displaying 26 - 50 of 2537

Performance of a C 60 + Ion Source on a Dynamic SIMS Instrument

July 1, 2006
Author(s)
Albert J. Fahey, John G. Gillen, P Chi, Christine M. Mahoney
… An IonOptika [1] C60+ ion source has been fitted onto a CAMECA [1] ims-4f. Stable ion beams of C60+ and C602+ have been obtained with typical … able to be focussed into a spot size of ~1 ?m and scanning ion images acquired. We have performed analyses to … Buckministerfullerene, cluster ion beams, ion source, SIMS ion source …

Noninvasive monitoring of ion current and ion energy during plasma processing

July 15, 2008
Author(s)
Mark A. Sobolewski
… technique has been developed for noninvasive monitoring of ion energy and ion current in plasma reactors. The technique relies on … electrical waveforms, the technique determines the total ion current, the plasma potential and sheath voltage … ion current, ion energy, electrical measurements, inductively …

Cold atomic beam ion source for focused ion beam applications

July 23, 2013
Author(s)
Brenton J. Knuffman, Adam V. Steele, Jabez J. McClelland
… We report measurements and modeling performed on an ion source based on ionization of a laser-cooled atomic beam. … for use in next-generation, high-resolution focused ion beam (FIB) systems. Our measurements of total ion current as a function of ionization conditions support a …

Inter-ion Coulomb interactions in a Magneto-Optical Trap Ion Source

May 19, 2011
Author(s)
Jabez J. McClelland, Brenton J. Knuffman, Adam V. Steele
… We have investigated the role played by inter-ion Coulomb interactions in a magneto-optical trap ion source (MOTIS). Using a Monte Carlo simulation accounting … MOTIS, ion beams, coulomb replusion … Inter-ion Coulomb interactions in a Magneto-Optical Trap Ion Source …

Ion-Molecule Reactions and Ion Energies in CF 4 Discharges

December 1, 1999
Author(s)
B. Peko, I. V. Dyakov, R. Champion, MVVS. Rao, James K. Olthoff
… E/N values ranging from 4 x 10 -18 V m 2 (4 to 25 kTd). Ion energy and ion intensity data for the Townsend discharges are analyzed … cross sections, dissociative charge transfer, ion energies, ion molecule reactions, Townsend discharge … Ion-Molecule Reactions and Ion Energies in CF 4 Discharges …

High-brightness Cs focused ion beam from a cold-atomic-beam ion source

May 2, 2017
Author(s)
Adam V. Steele, Andrew Schwarzkopf, Jabez J. McClelland, Brenton Knuffman
… of focal spot size and brightness in a focused ion beam system utilizing a laser-cooled atomic beam source … than the highest brightness observed in a Ga liquid metal ion source. The behavior of brightness as a function of beam … as next-generation circuit edit and nanoscale secondary ion mass spectrometry. …

Magneto-Optical-Trap-Based, High Brightness Ion Source for Use as a Nanoscale Probe

August 21, 2008
Author(s)
James L. Hanssen, Shannon B. Hill, Jon Orloff, Jabez J. McClelland
… on the demonstration of a low emittance, high brightness ion source based on magneto-optically trapped neutral atoms. Our source has ion optical properties comparable to or better than those of the commonly used liquid metal ion source. In addition, it has several advantages that offer …

Ion Solvation in Water Acetonitrile Mixtures

January 1, 2001
Author(s)
Raymond D. Mountain
… The results of a preliminary molecular dynamics study of ion (NA+ and Cl-) solvation and association in water, … is expected to be an important factor governing ion solvation and association. Results for ions in pure water … than the temperature in determining the degree of ion association. Preliminary results for the mixtures are …

Micro-fabricated stylus ion trap

August 7, 2013
Author(s)
Kyle S. McKay, Christian L. Arrington, Ehren D. Baca, Jonathan J. Coleman, Yves Colombe, Patrick Finnegan, Dustin A. Hite, Andrew E. Hollowell, Robert Jordens, John D. Jost, Dietrich G. Leibfried, Adam M. Rowen, Ulrich J. Warring, David J. Wineland, David P. Pappas, Andrew C. Wilson
… stylus Paul trap was designed to confine a single atomic ion for use as a sensor to probe the electric-field noise of … with the UV-LIGA technique to reduce the distance of the ion from the surface of interest. We detail the fabrication … environment. After cooling a motional mode of the ion at 4 MHz close to its ground state (n = 0.34 � 0.07), the …

Advances in source technology for focused ion beam instruments

April 1, 2014
Author(s)
Noel Smith, John Notte, Adam V. Steele
… Owing to the development of new ion source technology, users of focused ion beams (FIBs) have an increasingly wide array of uniquely … capable platforms to choose from. Specifically, the new ion sources are able to offer superior performance in several … ion sources, focused ion beams, inductively coupled plasma, …

Motional Squeezing for Trapped Ion Transport and Separation

August 20, 2021
Author(s)
Robert Sutherland, Shaun Burd, Daniel Slichter, Stephen Libby, Dietrich Leibfried
… Transport, separation, and merging of trapped ion crystals are essential operations for most large-scale … framework, we develop a new, general protocol for trapped ion transport, separation, and merging. We show that motional squeezing can prepare an ion wave packet to enable transfer from the ground state of …

Negative Cesium Sputter Ion Source for Generating Cluster Primary Ion Beams for Secondary Ion Mass Spectrometry Analysis

April 1, 2001
Author(s)
John G. Gillen, R L. King, B Freibaum, R Lareau, J Bennett, F Chmara
… The use of a cluster (or polyatomic) primary ion projectile for organic SIMS has been demonstrated to … use of a commercially available negative cesium sputter ion as a means of generating cluster ion beams on our Cameca IMS 4F and 6F magnetic sector SIMS … cluster beam, depth profiling, organic secondary ion mass spectrometry …

Helium Ion Microscopy: A New Technique for Semiconductor Metrology and Nanotechnology

January 1, 2007
Author(s)
Michael T. Postek, Andras Vladar, John A. Kramar, L A. Stern, John Notte, Sean McVey
… The Helium Ion Microscope (HIM) offers a new, potentially disruptive … the helium ions, it is theoretically possible to focus the ion beam into a smaller probe size relative to that of an … achievable. In contrast to the SEM, when the helium ion beam interacts with the sample, it generates …

Bright focused ion beam sources based on laser-cooled atoms

March 24, 2016
Author(s)
Jabez J. McClelland, Adam V. Steele, Brenton J. Knuffman, Kevin A. Twedt, Andrew D. Schwarzkopf, Truman M. Wilson
… Nanoscale focused ion beams (FIBs) represent one of the most useful tools in … ionization of laser cooled neutral atoms to produce the ion beam. The extremely cold temperatures attainable with … the brightness of the industry standard Ga+ liquid metal ion source. In this review we discuss the context of ion beam …

Trapped Highly Charged Ion Plasmas

January 1, 2002
Author(s)
E Takacs, John D. Gillaspy
… Electron beam Ion Trap (EBIT) devices are reviewed with special attention to applications in highly charged ion plasma research. EBIT properties are presented based on … parameter, Brillouin radius, magnetic trapping mode, ion cloud shape, density, temperature, rotation, and …

Capture of Highly Charged Ions in a Pseudo-Hyperbolic Paul Trap

July 12, 2019
Author(s)
Joan M. Dreiling, Aung Naing, Joseph Tan, Joshua Hanson, Shannon Hoogerheide, Samuel Brewer
… The confinement of ions in a radio-frequency (RF) trap (also known as a Paul … can be created in situ within the ion trap. Highly charged ions, on the other hand, are produced efficiently in … here, phase-space-optimized bunches of highly charged ions produced by an electron beam ion trap/source are …

Optimal Ion Trapping Experiment

May 10, 2007
Author(s)
Kevin J. Coakley
… because it goes dead after detecting the first trapped ion. There is a dead time {\delta} between the end of the … ion traps, probability theory, statistics … Optimal Ion Trapping Experiment …

Model for the Asymmetric DC and Fluctuating Conduction of an Ion Channel

October 16, 2008
Author(s)
B Robertson, John J. Kasianowicz
… A model for the asymmetric DC conduction of an ion channel is compared with measurements of the ionic … carried by an aqueous potassium chloride solution through ion channels formed by alpha hemolysin in a lipid bilayer. … and salt concentration is given. A model for the noise in ion conduction is also formulated. The randomness of proton …

Fast Ground State to Ground State Separation of Small Ion Crystals

October 10, 2024
Author(s)
Tyler Gugliemo, Dietrich Leibfried, Stephen Libby, Daniel Slichter
… into different subsets is critical for realizing trapped ion quantum computing architectures where ions are rearranged … suitable for separation of a mixed-species three-ion crystal on timescales similar to that of free expansion … trapped ions, quantum information, ion separation, mixed species …

Transport dynamics of single ions in segmented microstructured Paul trap arrays

August 4, 2006
Author(s)
Rainer Reichle, Dietrich G. Leibfried, Brad R. Blakestad, Joseph W. Britton, John D. Jost, Emanuel H. Knill, C. Langer, R Ozeri, Signe Seidelin, David J. Wineland
… It was recently proposed to use small groups of trapped ions as qubit carriers in miniaturized electrode arrays that … a large number of individual trapping zones, between which ions could be moved. This approach might be scalable for … of quantum information is achieved by transporting ions to and from separate memory and qubit manipulation zones …

Evidence for multiple mechanisms underlying surface-electric field noise in ion traps

December 27, 2018
Author(s)
J. A. Sedlacek, J. Stuart, Daniel Slichter, C. D. Bruzewicz, R. McConnell, J. M. Sage, J. Chiaverini
… Energetic ion bombardment, or ion milling, of ion-trap electrode surfaces has previously been shown to … Here, using motional heating of a single trapped strontium ion, we investigate the temperature dependence of this noise … anomalous heating, electric field noise, ion milling, ion trap …

Mobilities and Formation Kinetics of NH 4 + (NH 3 ) n Cluster Ions (n=0-3) in helium and helium/ammonia mixtures

January 1, 1997
Author(s)
M Krishnamurthy, J A. de Gouw, L N. Ding, V M. Bierbaum, S R. Leone
… NH 4 + (NH 3 ) n (n=1-3) cluster ions are formed in a field free flow tube section of a … measurements. The zero-field mobilities of the cluster ions in helium (22.1 +or-}0.3 cm 2 V -1 s -1 for NH 4 + , … of the geometric cross sections of the different cluster ions. The zero-field mobilities of NH 4 + (0.94 +or-} 0.15 cm …

Microfabricated Chip Traps for Ions

April 12, 2011
Author(s)
Jason Amini, Joseph W. Britton, Dietrich G. Leibfried, David J. Wineland
… ions, traps, microfabrication … Microfabricated Chip Traps for Ions …
Displaying 26 - 50 of 2537
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