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Displaying 1101 - 1125 of 1910

Optical-to-microwave frequency comparison with fractional uncertainty of 10 -15

October 1, 2007
Author(s)
Jason Stalnaker, Scott A. Diddams, Tara M. Fortier, K Kim, Leo W. Hollberg, James C. Bergquist, Wayne M. Itano, Marie Delaney, Luca Lorini, Windell Oskay, Thomas P. Heavner, Steven R. Jefferts, Filippo Levi, Thomas E. Parker, Jon H. Shirley
… $f({\rm Hg}^+) = 1 \, 064 \, 721 \, 609 \, 899 \, 145.30(69) \: {\rm Hz}$. …

Verification, Validation, and Variability of Virtual Standards

July 18, 2007
Author(s)
Dale P. Bentz
As the potential of computer modeling of hydration and microstructure development of cement-based materials approaches realization, the development of virtual standard test methods becomes a viable possibility. In creating these virtual standards, just as

A Roadmap For Metrology Interoperability

December 4, 2006
Author(s)
John A. Horst, S McSpadden
… Interoperability Summit (IMIS) was held March 28 - 30, 2006 at NIST in Gaithersburg, MD. Workers and decision …

Accurate Pattern Registration for Integrated Circuit Tomography

July 1, 2001
Author(s)
Zachary H. Levine, S Grantham, S Neogi, S P. Frigo, I McNulty, C C. Retsch, Y Wang, Thomas B. Lucatorto
… 100 nm resolution would require registration accuracy of 30 nm or better. This work demonstrates that even images that …
Displaying 1101 - 1125 of 1910
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