A Roadmap For Metrology Interoperability

Published

December 4, 2006

Author(s)

John A. Horst, S McSpadden

Abstract

An International Metrology Interoperability Summit (IMIS) was held March 28 - 30, 2006 at NIST in Gaithersburg, MD. Workers and decision makers in a variety of dimensional metrology corporations and organizations worldwide participated. The first day consisted of a series of lectures updating newcomers on the nature of the various dimensional metrology component interface standards efforts. During the second and third days of the summit, participants divided up into four different domains: Design, Planning, Execution, and Reporting. Each group was tasked to articulate and prioritize issues, solutions, and actions in their domain. Each issue was decomposed into potentially multiple solutions, and each solution into potentially multiple actions. Issues were also prioritized, both within each group and by all IMIS participants. Key issues identified of the highest importance where intellectual property concerns, need for standardization, and the need for an open, non-proprietary standard for the interface between part design and process planning.

Citation

NIST Interagency/Internal Report (NISTIR) - 7381

Report Number

7381

NIST Pub Series

NIST Interagency/Internal Report (NISTIR)

Pub Type

NIST Pubs

Download Paper

https://doi.org/10.6028/NIST.IR.7381

Keywords

inspection, inspection process execution, inspection process planning, interface, interoperability, metrology, summit

Citation

Horst, J. and McSpadden, S. (2006), A Roadmap For Metrology Interoperability, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.7381 (Accessed April 17, 2024)