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NIST Authors in Bold

Displaying 1251 - 1275 of 3841

Data for secondary electron production from ion precipitation at Jupiter II: Simultaneous and non-simultaneous target and projectile processes in collisions of Oq+ + H2 (q=0-8)

March 15, 2019
Author(s)
David R. Schultz, Heman Gharibnejad, Thomas Cravens, Stephen Houston
… the effects of secondary electrons produced by energetic ion precipitation at Jupiter, we extend the treatment to … this expanded set of processes, we show, via Monte Carlo ion transport simulation, that improved respresentation of … can improve modeling of the energy deposition by oxygen ion precipitation in an H2 atmosphere, providing a more …

Applications of Ultrafast Transient Infrared Spectroscopies

May 1, 2002
Author(s)
T Heimer, Edwin J. Heilweil
… and femtosecond methods performed at NIST, for studying hydrogen-bond and vibrational energy dynamics of molecular … IR spectroscopy, coherent up-pumping, electron transfer, hydrogen bonds, infrared arrays, self-association reactions, …

Analysis of E3 Transitions in Ag-like High-Z Ions Observed with the NIST EBIT

March 1, 2023
Author(s)
Yuri Ralchenko, David La Mantia, Aung S. Naing, Paul Szypryt, Joseph N. Tan, Endre Takacs, Dipti Dipti, Yang Yang, Adam Hosier, Hunter Staiger
… an insight into the population kinematics for Ag-like ions of heavy elements. We discuss the observed spectra and … Analysis of E3 Transitions in Ag-like High-Z Ions Observed with the NIST EBIT …

Unusual Fragmentations of Silylated Polyfluoroalkyl Compounds Induced by Electron Ionization

August 12, 2025
Author(s)
Yufang Zheng, Edward Erisman, Weihua Ji, Stephen Stein, William Wallace
… groups. For example, a previously unreported [M−111]⁺ ion was consistently observed in compounds containing three … confirmed the origin and elemental composition of this ion. MS2 experiments and full scan of TMS derivatives of … fluorinated alcohols, fluorinated carboxylic acids, ion fragmentation pathway, PFAS, reference library, reference …

Frequency Comparison of Al + and Hg + Optical Standards

June 24, 2007
Author(s)
Till P. Rosenband, David Hume, Anders Brusch, Luca Lorini, P. O. Schmidt, Tara M. Fortier, Jason Stalnaker, Scott A. Diddams, Nathan R. Newbury, W Swann, Windell Oskay, Wayne M. Itano, David J. Wineland, James C. Bergquist
… We compare the frequencies of two single ion frequency standards: 27 Al + and 199 Hg + . Systematic …

Nanocalorimetry for plasma metrology relevant to semiconductor fabrication

February 4, 2025
Author(s)
John Diulus, Carles Corbella Roca, Feng Yi, David LaVan, Berc Kalanyan, Mark McLean, Lakshmi Ravi Narayan, William Osborn, James Maslar, Andrei Kolmakov
… parasitic stimuli such as IR/visible/UV radiation and ion or electron fluxes. The system was successfully tested in a hydrogen plasma environment, and key performance metrics such …

Measurement-induced quantum phases realized in a trapped-ion quantum computer

June 2, 2022
Author(s)
Michael Gullans, Alexey Gorshkov, David Huse, Christopher Monroe, Crystal Noel, Pradeep Niroula, Daiwei Zhu, Andrew Risinger, Laird Egan, Debopriyo Biswas, Marko Cetina
… via random quantum circuits implemented on a trapped-ion quantum computer, where the system evolution is … Measurement-induced quantum phases realized in a trapped-ion quantum computer …

Maximizing Information Obtained From Secondary Ion Mass Spectra of Organic Thin Films Using Multivariate Analysis.

July 1, 2004
Author(s)
M S. Wagner, D G. Graham, B D. Ratner, David G. Castner
… Time -of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) can give detailed … molecular depth profiles obtained using an SF 5u+ primary ion beam. The effect of data normalization and scaling on the … Maximizing Information Obtained From Secondary Ion Mass Spectra of Organic Thin Films Using Multivariate …

Characterization of Emerging Ambient Pressure Mass Spectrometric Techniques using Time-of-Flight Secondary Ion Mass Spectrometry

March 28, 2014
Author(s)
Shinichiro Muramoto, Thomas P. Forbes, Matthew E. Staymates, John G. Gillen
… Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was used to characterize the … angles also corresponded with higher relative secondary ion yields as measured by ambient MS and ToF-SIMS. For LTP, a … oblique angles corresponded with higher relative secondary ion yields, although the analyte did not display a distinct …

Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for High-Throughput Characterization of Bio-Surfaces

January 1, 2003
Author(s)
S V. Roberson, A Sehgal, Albert J. Fahey, Alamgir Karim
… film. In this pre-liminary work, we tracked the secondary ion intensities of various species along the 45 mm length of … film. We noticed consistent trends, with the secondary ion signals for oxidized species steadily increasing with the … Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for High-Throughput …

Application of Inkjet Printing Technology to Produce Test Materials of 1,3,5-Trinitro-1,3,5 Triazcyclohexane for Trace Explosive Analysis

October 15, 2010
Author(s)
Eric S. Windsor, Marcela N. Najarro, Anna N. Bloom, Bruce A. Benner Jr, Robert A. Fletcher, John G. Gillen, Richard Lareau, Inho Cho, Mike Boldmand
… and jetted onto substrates suitable for calibration of the ion mobility spectrometry (IMS) instruments currently … explosives, inkjet printing, ion mobility spectrometry, trace explosives detection …
Displaying 1251 - 1275 of 3841
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