Curtin, A.
, Sanders, A.
and , R.
(2015),
A Simple Metric for Determining Resolution in Optical, Ion, and Electron Microscope Images, Microscopy and Microanalysis, [online], https://doi.org/10.1017/S1431927615000343
(Accessed January 20, 2025)
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A Simple Metric for Determining Resolution in Optical, Ion, and Electron Microscope Images
Published
Author(s)
, , Ryan Skinner
Abstract
A resolution metric intended for the resolution analysis of arbitrary spatially calibrated images is presented in this paper. By fitting a simple sigmoidal function to the pixel intensities across slices of the image taken perpendicular to light-dark edges, the mean distance over which the light-dark transition occurs can be determined. A fixed multiple of this characteristic distance is then reported as the image resolution. The prefactor is determined by analysis of direct scanning transmission electron microscope high-angle annular dark field (STEM HADDF) images of Si[110]. This metric has been applied to optical, scanning electron microscope (SEM), and helium ion microscope (HIM) images. This method provides quantitative feedback about image resolution independent of the tool on which the data was collected.Citation
Microscopy and Microanalysis
Volume
21
Issue
3
Pub Type
Journals
Download Paper
Keywords
resolution, precision imaging, microscopy
Citation
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Created May 26, 2015, Updated November 10, 2018