August 1, 2003
Author(s)
J E. Sanabia, S N. Goldie, L P. Ratliff, Lori S. Goldner, John D. Gillaspy
… In an attempt to verify these results, highly charged ion-irradiated silicon samples were prepared at the Electron Beam Ion Trap facility at the National Institute of Standards and … cross section, fluorescence, highly charged ion, photoluminescence, silicon … Highly Charged Ion Bombardment of Silicon Surfaces …