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Search Publications

NIST Authors in Bold

Displaying 29601 - 29625 of 74220

Impact of Sucrose Level on Storage Stability of Proteins in Freeze-Dried Solids: II. Correlation of Aggregation Rate with Protein Structure and Molecular Mobility

October 13, 2008
Author(s)
Bingquan S. Wang, Serguei Tchessalov, Marcus T. Cicerone, Nicholas W. Warne, Michael Pikal
The purpose of this study is to investigate the impact of sucrose level on storage stability of dried proteins and thus better understand the mechanism of protein stabilization by disaccharides in lyophilized products. Three IgG1 fusion proteins and two

Single Molecule Analysis of Electrodynamically Stretched DNA in Nanochannels

October 13, 2008
Author(s)
Samuel M. Stavis, Christian H. Reccius, John T. Mannion, Larry P. Walker, Harold G. Craighead
A rapid (~20 ms) and precise (~110 nm) analytical method is presented for stretching and interrogating single DNA molecules. Conformation, length, speed and fluorescence intensity measurements are obtained simultaneously. This confluence is a step forward

Contactless Differential Conductivity Detection

October 12, 2008
Author(s)
Gordon A. Shaw, David J. Ross, Steven E. Fick, Wyatt N. Vreeland
We propose a new technique, contactless differential conductivity detection (CDCD,) to improve the detection limit of contactless conductivity detection for capillary and microchannel electrophoresis. By exploiting a 3-electrode differential configuration

Oxide Reliability of SiC MOS Devices

October 12, 2008
Author(s)
Liangchun (. Yu, Kin P. Cheung, Jason P. Campbell, John S. Suehle, Kuang Sheng
Silicon carbide possesses excellent material properties for high temperature, high frequency and high power applications. Among all the device structures, MOSFET has advantages such as low gate leakage current, easier device control etc., and therefore

Bilateral comparison on polarization mode dispersion between KRISS and NIST

October 10, 2008
Author(s)
Seung-kwan Kim, Paul A. Williams
We made an international bilateral comparison on polarization mode dispersion between KRISS and NIST. Three mode-coupled artifacts were used for comparison. The average values of differential group delay measured by both institutes agreed well within their

Reanalysis of BASE Ventilation Data

October 10, 2008
Author(s)
Andrew K. Persily
In 2004, the National Institute of Standards and Technology (NIST) published an analysis of the ventilation data collected as part of the U.S. EPA Building Assessment Survey and Evaluation (BASE) study [1]. That analysis provided a unique dataset of office

Sounds of Atoms: Life in Science

October 10, 2008
Author(s)
Stephan J. Stranick
Early in setting up our nanoscience laboratory at Penn State, we were frustrated because we could not peer into the tunneling junctions of our scanning tunneling microscopes (STMs) to see what the atoms were doing. We were particularly vexed when singular

Calibration of a Radiance Standard for the NPP/OMPS Instrument

October 9, 2008
Author(s)
Bettye C. Johnson, James J. Butler, Scott J. Janz, Robert D. Saunders, John W. Cooper, Matthew G. Kowalewski, R Barnes
In June 2007, a spherical integrating source was calibrated in the National Aeronautics and Space Administration(NASA) Goddard Space Flight Center’s (GSFC) Calibration Facility as part of the prelaunch characterization program for the NPOESS Preparatory

Multichannel Decomposition and Isomerization of Octyl Radicals

October 9, 2008
Author(s)
Wing Tsang, William S. McGivern, Jeffrey A. Manion
The thermal cracking patterns from the decomposition and isomerization of octyl-1 radicals have been determined from the pyrolysis of n-octyl iodide in single pulse shock tube experiments at temperatures in the 850-1000 K range and pressures near 2 bar

Reference Ballistic Chronograph for Personal Armor Characterization

October 9, 2008
Author(s)
Nicholas Paulter, Donald R. Larson
Ballistic armor is evaluated using a V50 parameter, which describes the velocity above which half the shots are expected to penetrate a given type of body armor. The greater the error and uncertainty in measuring the velocity of the bullet, the greater the

Linking Accelerated Laboratory Test with Outdoor Performance Results for a Model Epoxy Coating System

October 8, 2008
Author(s)
Xiaohong Gu, Deborah S. Jacobs, Walter E. Byrd, Brian Dickens, Iliana Vaca-Trigo, William Meeker, Tinh Nguyen, Jonathan W. Martin
Laboratory and field exposure results have been successfully linked for a model epoxy coating system. The mathematical model used in making this linkage only assumed that the total effective dosage, additivity law, and reciprocity laws were valid. In this

THz Investigations of Condensed Phase Biomolecular Systems

October 8, 2008
Author(s)
Kevin O. Douglass, Hailiang Zhang, Susan K. Gregurick, Karen M. Siegrist, David F. Plusquellic
Terahertz (THz) spectroscopic investigations of crystalline dipeptide nanotubes are discussed in the frequency region from 0.6 THz (2 cm-1) to 3 THz (100 cm-1). The THz region provides access to collective modes of biomolecular systems and is therefore

Shape and Size Analysis and Standards

October 6, 2008
Author(s)
Afzal A. Godil, Sanford P. Ressler
The field of anthropometry is the science of measurement of the human body from which comparisons and characterizations of the size and shape of the body in different postures can take place. The size and shape of human bodies are important in many

Alpha-Dot or Not: Comparison of Two Single Atom Optical Clocks

October 5, 2008
Author(s)
Till P. Rosenband, David Hume, Chin-Wen Chou, J.C. Koelemeij, A. Brusch, Sarah Bickman, Windell Oskay, Tara M. Fortier, Jason Stalnaker, Scott A. Diddams, Nathan R. Newbury, William C. Swann, Wayne M. Itano, David J. Wineland, James C. Bergquist
Repeated measurements of the frequency ratio of Hg + and Al + single-atom optical clocks over the course of a year yield a constraint on the possible temporal variation of the fine-structure constant a. The time variation of the measured ratio corresponds

Chip-scale atomic devices: precision atomic instruments based on MEMS

October 5, 2008
Author(s)
John E. Kitching, Svenja A. Knappe, Vladislav Gerginov, Vishal Shah, Peter D. Schwindt, Brad Lindseth, Elizabeth A. Donley, Ying-ju Wang, Eleanor Hodby, Matt Eardley, Ricardo Jimenez Martinez, William C. Griffith, Andrew Geraci, Jan Preusser, Tara C. Liebisch, Hugh Robinson, Leo Hollberg
We describe recent work at NIST to develop compact, low-power instruments based on a combination of precision atomic spectroscopy, advanced diode lasers and microelectromechanical systems (MEMS). Designed to be fabricated in parallel in large numbers

NIST F1 and F2

October 5, 2008
Author(s)
Thomas P. Heavner, Tom Parker, Jon H. Shirley, Steven R. Jefferts
The National Institute of Standards and Technology operates a cesium fountain primary frequency standard, NIST-F1, which has been contributing to International Atomic Time (TAI) since 1999. At the time of the last Symposium on Frequency Standards and

Weight Functions for Biases in Atomic Frequency Standards

October 5, 2008
Author(s)
Jon H. Shirley
We present a unified treatment of frequency-standard biases that vary significantly during the time of measurement. We introduce three time-dependent weight functions built from the solution of the unperturbed equations of motion for a two-level system. By

CTOA Measurements of Welds in X100 Pipeline Steel

October 3, 2008
Author(s)
Elizabeth S. Drexler, Philippe P. Darcis, Christopher N. McCowan, John M. Treinen, Avigdor Shtechman, Roni Reuven, Thomas A. Siewert, Robert Smith, J. Merritt, Joseph D. McColskey
A suite of tests characterizing X100 pipeline steels was initiated at the National Institute of Standards and Technology (NIST) in Boulder. Part of the test matrix included testing the toughness of the base metal, welds, and heat-affected zones (HAZ) using
Displaying 29601 - 29625 of 74220