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Displaying 276 - 300 of 757

PASSING THE BATON: Message FROM THE INCOMING EDITOR-IN-CHIEF

June 1, 2015
Author(s)
Hamid Gharavi
This incoming Editor In Chief's (EIC) message is expected to appear in the next issue of the IEEE wireless communications. The editorial team will be under the leadership of the new EIC for a period of three years.

Experimentally, How Does Cu TSV Diameter Influence its Stress State?

May 27, 2015
Author(s)
Chukwudi A. Okoro, Lyle E. Levine, Yaw S. Obeng, Ruqing Xu
In this work, an experimental study of the influence of Cu through-silicon via (TSV) diameter on stress build up was performed using synchrotron-based X-ray microdiffraction technique. Three Cu TSV diameters were studied; 3 µm, 5 µm and 8 µm, all of which

Rectangular-Waveguide Impedance

May 22, 2015
Author(s)
Dylan F. Williams, Jeffrey A. Jargon, Uwe Arz, Paul D. Hale
We discuss the role of the wave impedance in temporal measurements in rectangular waveguide and present a simple rule-of-thumb for estimating the difference of the temporal electric and magnetic field waveforms supported by the dominant TE10 mode. We also

Electro-thermal Simulation of 1200 V 4H-SiC MOSFET Short-Circuit SOA

May 10, 2015
Author(s)
Tam H. Duong, Jose M. Ortiz, David W. Berning, Allen R. Hefner Jr., Sei-Hyung Ryu, John W. Palmour
The purpose of this paper is to introduce a dynamic electro-thermal simulation and analysis approach for device design and short-circuit safe-operating-area (SOA) characterization using a physics-based electro-thermal Saber®* model. Model parameter

Compact Nano-Mechanical Plasmonic Phase Modulators

April 1, 2015
Author(s)
Brian S. Dennis, Michael Haftel, David Czaplewski, Daniel Lopez, Girsh Blumberg, Vladimir Aksyuk
The miniaturization of photonic devices is fundamentally limited by the index of refraction of the constituent materials if light is confined in dielectric nanostructures. By coupling electromagnetic fields to metal's free electrons plasmonic devices

Measuring a Device's Susceptibility to LTE: Preliminary Approaches

March 15, 2015
Author(s)
Jason B. Coder, John M. Ladbury
Previous testing has shown that measuring a device’s susceptibility to a radiated, broadband signal can present a different set of challenges than those faced when testing with a narrow-band signal. Decisions ranging from choosing a measurement facility to

Nationwide Public Safety Broadband Network Deployment: Network Parameter Sensitivity Analysis

March 15, 2015
Author(s)
Richard A. Rouil, Antonio Izquierdo Manzanares, Camillo A. Gentile, David W. Griffith, Nada T. Golmie
The legislation included in the middle class tax relief and job creation act of 2012 established the First Responder Network Authority (FirstNet) for the purpose of deploying and running a nationwide Long Term Evolution (LTE) network for Public Safety

Measuring the Resiliency of Cellular Base Station Deployments

March 11, 2015
Author(s)
David W. Griffith, Richard A. Rouil, Antonio Izquierdo Manzanares, Nada T. Golmie
The National Public Safety Telecommunications Council (NPSTC) has defined Resiliency as the ability of a network to withstand the loss of assets and to recover quickly from such losses. How to measure the resiliency of a base station deployment is an

Widebend CTL cell to measure operating range of UHF RFID

March 5, 2015
Author(s)
Jehoon Yun, YongChae Jeong, David R. Novotny, Jeffrey R. Guerrieri
A wideband coupled transmission line (CTL) cell to measure the operating range of an UHF RFID (ORUR) is presented. Also, an ORUR test system is proposed to increase the isolation to more than 55 dB. It is shown that the ORUR measured by this proposed cell

Parameter Estimation and Uncertainty Evaluation in a Low Rician K-Factor Reverberation-Chamber Environment

October 15, 2014
Author(s)
Chih-Ming Wang, Catherine A. Remley, Ansgar T. Kirk, Ryan J. Pirkl, Christopher L. Holloway, Dylan F. Williams, Paul D. Hale
In this paper we study statistical methods for estimating the Rician K-factor when this parameter is small. A fiducial approach for making statistical inference on the K-factor is discussed. The approach requires a Monte Carlo method to compute the

NIST Framework and Roadmap for Smart Grid Interoperability Standards, Release 3.0

October 1, 2014
Author(s)
Chris Greer, David A. Wollman, Dean Prochaska, Paul A. Boynton, Jeffrey A. Mazer, Cuong Nguyen, Gerald FitzPatrick, Thomas L. Nelson, Galen H. Koepke, Allen R. Hefner Jr., Victoria Yan Pillitteri, Tanya L. Brewer, Nada T. Golmie, David H. Su, Allan C. Eustis, David Holmberg, Steven T. Bushby
Section 1305 of the Energy Independence and Security Act (EISA) of 2007 (Pub. L. 110-140) directs NIST ‘‘to coordinate the development of a framework that includes protocols and model standards for information management to achieve interoperability of

A 100 Tohm Guarded Hamon Transfer Standard

August 24, 2014
Author(s)
Dean G. Jarrett, Edward O'Brien, Marlin E. Kraft
Guarded Hamon transfer standards are used at NIST for scaling to high resistance levels. An improved design for a guarded Hamon transfer standard in the range from 1 TΩ to 100 TΩ is described. Measurements taken to select the primary and guard resistor

Photonic-assisted Endoscopic Analysis of Guided W-band Pulses

August 24, 2014
Author(s)
Jeffrey A. Jargon, DongJoon Lee, JaeYong Kwon
We present a photonic-assisted time-domain measurement technique for exploring millimeter-wave propagation through a W-band waveguide. The electric fields, guided inside a rectangular waveguide, are sampled using a sub-millimeter-scale electro-optic probe

Broadband Rydberg Atom Based Self-Calibrating RF E-field Probe

August 16, 2014
Author(s)
Christopher L. Holloway, Joshua A. Gordon, Steven R. Jefferts, Thomas P. Heavner
We present a significantly new approach for an electric (E) field probe. The probe is based on the interaction of RF-fields with Rydberg atoms, where alkali atoms are excited optically to Rydberg states and the applied RF-field alters the resonant state of

Characterizing a Device's susceptibility to broadband signals: A case study

August 4, 2014
Author(s)
Jason B. Coder, John M. Ladbury, David Hunter
It is common for electronic devices to be tested for their susceptibility to radiated signals they may be exposed to during their normal operation. A reverberation chamber is well suited to perform this type of testing because it can expose the device

Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields

July 23, 2014
Author(s)
Nathan D. Orloff, Jan Obrzut, Christian J. Long, Thomas F. Lam, James C. Booth, David R. Novotny, James A. Liddle, Pavel Kabos
The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. To

Energy Harvesting from the Human Leg Motion

July 23, 2014
Author(s)
Kamran Sayrafian, Antonio M. Possolo, Nathalie Yarkony
Kinetic energy harvested from the human body motion seems to be one of the most attractive and convenient solution for wearable wireless sensors in healthcare applications. Due to their small size, such sensors typically have a very limited battery-powered

Colored Noise and Regularization Parameter Selection for Waveform Metrology

July 8, 2014
Author(s)
Andrew M. Dienstfrey, Paul D. Hale
We study six regularization parameter selection algorithms applied to deconvolution problems relevant for characterization of high-speed communication measurement systems. In particular we investigate the performance of these selectors in the presence of

Inter-BAN Interference Mitigation: A Correlated Equilibrium Perspective

June 13, 2014
Author(s)
Vladimir Marbukh, Kamran Sayrafian, Martina Barbi, Mehdi Alasti
A Body Area Network (BAN) is a wireless network of wearable or implantable computing devices. A BAN typically consists of several miniaturized radio-enabled body sensor/actuator that communicate with a single coordinator. Medical applications usually

A Prescription for THz Transistor Characterization

April 4, 2014
Author(s)
Dylan F. Williams
Advances in microwave wafer probes and vector network analyzers have opened up a whole new world of discovery in microwave metrology, making possible accurate on-wafer measurements in printed transmission lines at microwave, millimeter-wave, sub-millimeter

Calibrations for Millimeter-Wave Silicon Transistor Characterization

March 1, 2014
Author(s)
Dylan F. Williams, Phillip Corson, Sharma Jahnavi, Krishnaswamy Harish, Wei Tai, George Zacharias, Ricketts David, Watson Paul, Dacquay Eric, Voinigescu Sorin
This paper compares on-wafer thru-reflect-line (TRL) and off-wafer short-open-load-thru (SOLT) and line-reflect-reflect-match (LRRM) vector-network-analyzer probe-tip calibrations for amplifier characterization and parasitic-extraction calibrations for
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