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Displaying 276 - 300 of 1400

Large-Signal-Network-Analyzer Phase Calibration on an Arbitrary Grid

April 30, 2019
Author(s)
Aric Sanders, Dylan Williams, Joshua Kast, Kate Remley, Rob Horansky
We have developed a method for improving the synchronization of large-signal network analyzers and transferring "cross-frequency" phase calibrations from a calibrated sampling oscilloscope to the large-signal vector network analyzer on an arbitrary

Channel Characterization and Delay Optimization for Industrial Wireless Control Systems

March 4, 2019
Author(s)
Xiaolin Jiang, Zhibo Pang, Rick Candell, Dacfey Dzung, Michele Luvisotto, Carlo Fischione
Wireless communication is gaining popularity in industry for its simple deployment, mobility and low cost. Ultra low latency and high reliability requirements of mission critical industrial applications are highly demanding for wireless communication, and

Propagating Measurement Uncertainty to Microwave Amplifier Nonlinear Behavioral Models

February 1, 2019
Author(s)
Dylan F. Williams, Laurence T. Stant, Martin J. Salter, Nick M. Ridler, Peter Aaen
We propagate for the first time correlated measurement uncertainties into a nonlinear behavioral model of a millimetre-wave amplifier. We make use of the NIST Microwave Uncertainty Framework to evaluate the uncertainties in large-signal electromagnetic

DETECTION OF INCUMBENT RADAR IN THE 3.5 GHZ CBRS BAND

November 25, 2018
Author(s)
Raied Caromi, Michael R. Souryal, Wen-Bin Yang
In the 3.5 GHz Citizens Broadband Radio Service, 100 MHz of spectrum will be shared between commercial users and federal incumbents. Dynamic use of the band relies on a network of sensors dedicated to detecting the presence of federal incumbent signals and

Jitter Sensitivity Analysis of the Superconducting Josephson Arbitrary Waveform Synthesizer

November 4, 2018
Author(s)
Christine A. Donnelly, Justus Brevik, Paul Dresselhaus, Pete Hopkins, Samuel P. Benz
We present the first jitter sensitivity analysis of a superconducting voltage reference waveform synthesizer with fundamentally accurate output pulses. Successful deployment of a reference waveform source at microwave frequencies will represent a new

Precision Optical Antenna Alignment System for Tracking Antennas in 6-DOF

November 4, 2018
Author(s)
Joshua A. Gordon, David R. Novotny, Michael S. Allman
We present on an all-optical spatial metrology system, the PiCMM, that aids in the alignment and tracking of antennas with accuracies on the order of 25 microns and 0.01 deg. This system speeds up millimeter-wave antenna alignment, does not require contact

PSCR 2017 Stakeholder Conference Presentation Materials -- Day 1

October 16, 2018
Author(s)
Jeremy E. Benson, Jeff Johnson, Eric W. Anderson, Carol Politi, TRX Systems, Inc., Anthony Rowe, A Shkel, Chenji Harsha, Nancy French, Murat Yuskel, Benjamin J. Posthuma, Margaret Pinson, Dereck R. Orr
This document is a compilation of the slides presented during Day 3 of the 2017 Public Safety Communications Research Program's (PSCR) Annual Stakeholder Conference. Day 3 topics include PSCR research plans and results for Location-Based Services

PSCR 2017 Stakeholder Conference Presentation Materials -- Day 2

October 16, 2018
Author(s)
Jason D. Kahn, Anthony Trevino, San Antonio Police Dept, Heather M. Evans, Joe Fournier, Canada's Centre for Security Science, David Lund, Public Safety Communication Europe Forum, Gordon Shipley, UK Home Office Emergency Service Mobile Communications Programme, Dereck R. Orr, Jeff Bratcher, Rich Reed, Salim Patel, AT&T Technology Architecture Planning, Ryan Felts, Marc Leh, Mary F. Theofanos, Kristen Greene
This document is a compilation of the slides presented during Day 2 of the 2017 Public Safety Communications Research Program's (PSCR) Annual Stakeholder Conference. Day 2 topics include PSCR research plans and results for Crowdsourcing Open Innovation

On-Wafer Transistor Characterization to 750 GHz -the approach, results, and pitfalls

October 14, 2018
Author(s)
Dylan Williams, Jerome Cheron, Ben Jamroz, Richard Chamberlin
We review approaches developed at the National Institute of Standards and Technology for on-wafer transistor characterization and model extraction at sub-millimeter-wave wavelengths, and compare them to more common approaches developed for use at lower
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