Jarrett, D.
, O'Brien, E.
and Kraft, M.
(2014),
A 100 Tohm Guarded Hamon Transfer Standard, CPEM 2014 Conference Digest, Rio de Janeiro, -1
(Accessed October 16, 2024)
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A 100 Tohm Guarded Hamon Transfer Standard
Published
Author(s)
, Edward O'Brien,
Abstract
Guarded Hamon transfer standards are used at NIST for scaling to high resistance levels. An improved design for a guarded Hamon transfer standard in the range from 1 TΩ to 100 TΩ is described. Measurements taken to select the primary and guard resistor elements are described, as well as the process used to clean the resistor elements. The selection process for resistor elements focused on choosing the smallest settling times and narrowest range of corrections from nominal value. Key aspects of this guarded Hamon transfer standard are the elimination of charge-storing materials in its connections, selection of resistors to minimize leakage currents, and the hermetic sealing of all the elements inside one enclosure.Proceedings Title
CPEM 2014 Conference Digest
Conference Dates
August 24-29, 2014
Conference Location
Rio de Janeiro
Conference Title
Conference on Precision Electromagnetic Measurements (CPEM) 2014
Pub Type
Conferences
Keywords
Measurement, standard resistor, guarded Hamon transfer standard, settling time, scaling
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created August 24, 2014, Updated February 19, 2017