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Standards

Reference materials

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Displaying 326 - 350 of 538

The MEMS 5-in-1 Test Chips (Reference Materials 8096 and 8097)

March 27, 2013
Author(s)
Janet M. Cassard, Jon C. Geist, Craig D. McGray, Richard A. Allen, Muhammad Y. Afridi, Brian J. Nablo, Michael Gaitan, David G. Seiler
This paper presents an overview of the Microelectromechanical Systems (MEMS) 5-in-1 Reference Material (RM), which is a single test chip with test structures from which material and dimensional properties are obtained using five documentary standard test

Characterization of the NIST Shellfish Standard Reference Material 4358

March 1, 2013
Author(s)
Svetlana Nour, Kenneth G. Inn, James J. Filliben, Hank dan der Gaast, Lee Chung Men, M.D. Calmet, P Povinec, Y Takata, M. Wisdom, K. Nakamura, Pia Vesterbacka, Ching-Chung Huang, S M. Vakulovsky
A new Shellfish Standard Reference Material (SRM 4358) was developed at the National Institute of Standards and Technology (NIST) via an international intercomparison project that involved 12 laboratories-participants from 9 countries (Table 1). This

March 2013 SRM Spotlight

February 25, 2013
Author(s)
Regina R. Montgomery
The SRM Spotlight is a newsletter published by the Measurement Services Division for users of NIST standard reference materials. The Spotlight announces new reference materials and provides information about their use. In addition, this newsletter contains

User's Guide for RM 8096 and 8097: The MEMS 5-in-1, 2013 Edition

February 15, 2013
Author(s)
Janet M. Cassard, Jon C. Geist, Theodore V. Vorburger, David T. Read, Michael Gaitan, David G. Seiler
The Microelectromechanical Systems (MEMS) 5-in-1 is a reference device sold as a NIST Reference Material (RM) that contains MEMS test structures on a test chip. The two RM chips (8096 and 8097) provide for both dimensional and material property

Fourth NIST Workshop on Carbon Nanotubes: Chirality Measurements

January 30, 2013
Author(s)
Jeffrey A. Fagan
On September 23rd and 24th, 2010, the National Institute of Standards and Technology (NIST) hosted the fourth in a series of workshops addressing measurement needs for single wall carbon nanotubes (SWCNTs). Attendees representing an international community

Breast Cancer Biomarker Measurements and Standards

January 24, 2013
Author(s)
Kenneth D. Cole, Lili Wang, Hua-Jun He
Cancer is a heterogeneous disease characterized by changes in the levels and activities of important cellular proteins, including oncogenes and tumor suppressors. Genetic mutations cause changes in protein activity and protein expression levels that result

Standard Operating Procedures for Smolder Ignition Testing of Upholstery Fabrics

December 11, 2012
Author(s)
Rick D. Davis, Mauro Zammarano, Szabolcs Matko, Roland H. Kraemer
This manuscript describes a methodology to measure the influence of an upholstery cover fabric to promote smoldering mass loss of a small-scale mock-up. The primary test metric is total mock-up mass loss after 45 min exposure to the smoldering ignition

Certification of NIST SRM 2569 Lead Paint Films for Children's Products

October 15, 2012
Author(s)
John L. Molloy, John R. Sieber, Karen E. Murphy, Stephen E. Long, Stefan D. Leigh
SRM 2569 Lead Paint Films for Children’s Products is a new Standard Reference Material (SRM) developed for use primarily with XRF instrumentation. It consists of three paint coatings, with nominally 0 mg/kg, 90 mg/kg, and 300 mg/kg of Pb added, on

Extending single-photon optimized superconducting transition edge sensors beyond the single-photon counting regime

October 2, 2012
Author(s)
Thomas Gerrits, Brice R. Calkins, Nathan A. Tomlin, Adriana E. Lita, Alan L. Migdall, Sae Woo Nam, Richard P. Mirin
Photon number resolving transition-edge sensors (TES) are the cutting-edge enabling technology for high quantum efficiency photon counting when the number of photons of an input state needs to be determined. The TES developed at NIST reliably show system

Characterization of Perchlorate in a New Frozen Human Urine Standard Reference Material

October 1, 2012
Author(s)
Lee L. Yu, William C. Davis, Rabia Oflaz, Gregory C. Turk, Jeff M. Jarrett, Liza Valentin, Benjamin C. Blount, Dennis D. Leber, Eric L. Kilpatrick
Perchlorate, an inorganic anion, has recently been recognized as an environmental contaminant by the U.S. Environmental Protection Agency (EPA). Assessment of human exposure to perchlorate requires measurement of the anion in urine. Although the

SRM Spotlight

September 3, 2012
Author(s)
Regina R. Montgomery
The SRM Spotlight is a newsletter published by the Measurement Services Division for users of NIST standard reference materials. The Spotlight announces new reference materials and provides information about their use. In addition, this newsletter contains

Limitations of X-ray reflectometry in the presenceof surface contamination

June 13, 2012
Author(s)
Donald A. Windover, David L. Gil
Intentionally deposited thin films exposed to atmosphere often develop unintentionally deposited few monolayer films of surface contamination. This contamination arises from the diverse population of volatile organics and inorganics in the atmosphere. Such

Parametric uncertainty in nanoscale optical dimensional measurements

June 10, 2012
Author(s)
James E. Potzick, Egon Marx
Image modeling establishes the relation between an object and its image when an optical microscope is used to measure the dimensions of an object of size comparable to the illumination wavelength. It accounts for the influence of all of the parameters

Bilateral Comparison between NIST and PTB for Flows of High Pressure Natural Gas

April 6, 2012
Author(s)
Aaron N. Johnson, B Mickan, H. Toebben, Tom Kegel
In 2009 NIST developed a U.S. national flow standard to provide traceability for flow meters used for custody transfer of pipeline quality natural gas. NIST disseminates the SI unit of flow by calibrating a customer flow meter against a parallel array of

The MEMS 5-in-1 Reference Materials (RM 8096 and 8097)

March 21, 2012
Author(s)
Janet M. Cassard, Jon C. Geist, Michael Gaitan, David G. Seiler
The MEMS 5-in-1 Reference Material (RM) contains test structures for five standard test methods on one test chip, so companies can compare their in-house measurements taken on the RM with NIST measurements, thereby validating their use of the documentary
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