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Displaying 351 - 375 of 546

Limitations of X-ray reflectometry in the presenceof surface contamination

June 13, 2012
Author(s)
Donald A. Windover, David L. Gil
Intentionally deposited thin films exposed to atmosphere often develop unintentionally deposited few monolayer films of surface contamination. This contamination arises from the diverse population of volatile organics and inorganics in the atmosphere. Such

Parametric uncertainty in nanoscale optical dimensional measurements

June 10, 2012
Author(s)
James E. Potzick, Egon Marx
Image modeling establishes the relation between an object and its image when an optical microscope is used to measure the dimensions of an object of size comparable to the illumination wavelength. It accounts for the influence of all of the parameters

Bilateral Comparison between NIST and PTB for Flows of High Pressure Natural Gas

April 6, 2012
Author(s)
Aaron N. Johnson, B Mickan, H. Toebben, Tom Kegel
In 2009 NIST developed a U.S. national flow standard to provide traceability for flow meters used for custody transfer of pipeline quality natural gas. NIST disseminates the SI unit of flow by calibrating a customer flow meter against a parallel array of

The MEMS 5-in-1 Reference Materials (RM 8096 and 8097)

March 21, 2012
Author(s)
Janet M. Cassard, Jon C. Geist, Michael Gaitan, David G. Seiler
The MEMS 5-in-1 Reference Material (RM) contains test structures for five standard test methods on one test chip, so companies can compare their in-house measurements taken on the RM with NIST measurements, thereby validating their use of the documentary

March 2012 SRM Spotlight.

February 28, 2012
Author(s)
Regina R. Montgomery
The SRM Spotlight is a newsletter published by the Measurement Services Division for users of NIST standard reference materials. The Spotlight announces new reference materials and provides information about their use. In addition, this newsletter contains

SRM NIST Standard Reference Materials Catalog, 2012

December 9, 2011
Author(s)
Regina R. Montgomery
NIST Standard Reference Materials (SRMs) are used by industry, government, and academia to ensure the highest quality measurements. This catalog lists over 1200 individual reference materials produced and sold by NIST, each with carefully assigned values

Determination of Moisture Content of Single-Wall Carbon Nanotubes

October 17, 2011
Author(s)
Rolf L. Zeisler, Rabia Oflaz, Ralph E. Sturgeon, Rick L. Paul, Brian E. Lang, Jeffrey A. Fagan, Joseph W. Lam, Anthony Windust, P Grinberg, Benoit Simard, Christopher T. Kingston
Several techniques were evaluated for the establishment of reliable water/moisture content of single-wall carbon nanotubes. Karl Fischer titration (KF) provides for a direct measure of the water content and was used for benchmarking against results

Extending single-photon optimized superconducting transition edge sensors beyond the single-photon counting regime

September 19, 2011
Author(s)
Thomas Gerrits, Brice R. Calkins, Nathan A. Tomlin, Adriana E. Lita, Alan L. Migdall, Sae Woo Nam, Richard P. Mirin
Photon number resolving transition-edge sensors (TES) are the cutting-edge enabling technology for high quantum efficiency photon number counting. The TES developed at NIST reliably show system detection efficiencies of more than 95%, and even approach 99%

User's Guide for SRM 2494 and 2495: The MEMS 5-in-1, 2011 Edition

September 6, 2011
Author(s)
Janet M. Cassard, Jon C. Geist, Theodore V. Vorburger, David T. Read, David G. Seiler
The Microelectromechanical Systems (MEMS) 5-in-1 is a standard reference device sold as a NIST Standard Reference Material (SRM) that contains MEMS test structures on a test chip. The two SRM chips (2494 and 2495) provide for both dimensional and material

Determination of Fat-Soluble Vitamins and Carotenoids in Standard Reference Material 3280 Multivitamin/Multielement Tablets by Liquid Chromatography with Absorbance Detection

August 17, 2011
Author(s)
Jeanice M. Brown Thomas, Katherine Sharpless, Catherine Rimmer, James Yen
The concentrations of selected fat-soluble vitamins and carotenoids in Standard Reference Material (SRM) 3280 Multivitamin/Multielement Tablets have been determined by two independent liquid chromatographic methods with measurements performed by the

July 2011 SRM Spotlight

July 5, 2011
Author(s)
Regina R. Montgomery
The SRM Spotlight is a newsletter published by the Measurement Services Division for users of NIST standard reference materials. The Spotlight announces new reference materials and provides information about their use. In addition, this newsletter contains

Certification of Vitamins and Carotenoids in SRM 3280 Multivitamin/Multielement Tablets

April 24, 2011
Author(s)
Lane C. Sander, Katherine E. Sharpless, Stephen A. Wise, Bryant C. Nelson, Karen W. Phinney, Barbara J. Porter, Catherine A. Rimmer, Jeanice M. Brown Thomas, Laura J. Wood, James H. Yen, David L. Duewer, R. Atkinson, R. Chen, R. Goldschmidt, W.R. Wolf, I-P Ho, M. Betz
A new multivitamin/multielement dietary supplement Standard Reference Material (SRM) has been issued by the National Institute of Standards and Technology (NIST) with certified and reference concentration values for 13 vitamins, 24 elements, and two

SRM Spotlight

February 18, 2011
Author(s)
Regina R. Montgomery
The SRM Spotlight is a newsletter published by the Measurement Services Division for users of NIST standard reference materials. The Spotlight announces new reference materials and provides information about their use. In addition, this newsletter contains

November 2010 SRM Spotlight

November 16, 2010
Author(s)
Regina R. Montgomery
The SRM Spotlight is a newsletter published by the Measurement Services Division for users of NIST standard reference materials. The Spotlight announces new reference materials and provides information about their use. In addition, this newsletter contains
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