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Physics

Condensed matter

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Displaying 1176 - 1200 of 1253

Quantitative Surface Analysis by Electron Spectroscopy

April 1, 1978
Author(s)
Cedric J. Powell
An overview is given of a new cooperative project under the Implementing Agreement between the Technology Administration, U.S. Department of Commerce, and the Agency of Industrial Science and Technology, Japanese Ministry of International Trade and

Surface Analysis by Electron Spectroscopy at High Pressures

March 1, 1978
Author(s)
Cedric J. Powell
Surface analyses are now made by techniques such as Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS), and appearance potential spectroscopy (APS). These techniques utilize low-energy electrons and have high surface sensitivity but

Auger Electron Spectroscopy

February 1, 1978
Author(s)
Cedric J. Powell
A convenient measure of surface sensitivity in Auger-electron spectroscopy (AES) and x-ray photoelectron spectroscopy (XPS) is the mean escape depth (MED). If the effects of elastic-electron scattering are neglected, the MED is equal to the electron

High Resolution Photoemission Study of Condensed Layers of Nitrogen and Carbon Monoxide

February 1, 1978
Author(s)
P R. Norton, R L. Tapping, H P. Broida, John William Gadzuk, B Waclawski
Values are reported for the absolute yields of KVV Auger electrons from beryllium and L 23VV Auger electrons from aluminum excited by 60- to 220-keV proton bombardment. The measurements were made using semi-infinite evaporated samples, and the results were

Quantitative Surface Analysis by X-Ray Photoelectron Spectroscopy

January 1, 1978
Author(s)
Cedric J. Powell
Measurements have been made of the relative intensities of the principal features in X-ray photoelectron spectra of indium, lead, and aluminum oxide and compared with those expected from a simple model for the photoemission process. Systematic effects in

Surface Characterization: Present Status and the Need for Standards

January 1, 1978
Author(s)
Cedric J. Powell
A summary is given of the present status and use of surface-characterization measurements in the United States. Attention is primarily devoted to those properties needed to characterize a solid surface, specifically the determination of surface composition

Angle-resolved photoemission from crystal-field-split adatom levels

April 15, 1977
Author(s)
J F. Herbst
We investigate the angular distribution of photoelectrons emitted from atoms physisorbed on the surface of a metal. The crystalline electric field of the surface is represented by a small number of point charges in the vicinity of the adatom, and the

Secondary-Electron Energy Distribution in High-Energy Photoemission

January 1, 1977
Author(s)
David R. Penn
We have calculated the energy distribution of secondary electrons observed in core-level XPS or core-level synchrotron photoemission experiments on Al. The secondary electrons are produced when the photoexcited primary electrons scatter inelastically from
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