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Displaying 1151 - 1175 of 1237

Bound Hole Pairs in Ni: Evidence from Photoemissions

November 1, 1979
Author(s)
David R. Penn
I show that the Ni d-band density of states contains a peak due to excitations of bound hole pairs. The density of states is observed directly in photoemission experiments which show a satellite peak below the bottom of the d bands.

Spin and Energy Analyzed Photoemission: A Feasibility Analysis

November 1, 1979
Author(s)
Daniel T. Pierce, C Kuyatt, Robert Celotta
New scientific opportunities, particularly for investigation of surface magnetism, will be provided by spin and energy analyzed photoemission. Electron-optical conservation laws and phase space concepts are summarized and applied to determine the

Surface Magnetization of Ferromagnetic Ni(110): A Polarized LEED Experiment

September 3, 1979
Author(s)
Robert Celotta, Daniel T. Pierce, G Wang, S Bader, G P. Felcher
The magnetic field dependence (hysteresis curve) and the temperature dependence of the magnetization at a Ni(110) surface was measured by polarized low-energy electron diffraction. The diffracted intensities are spin dependent by a few percent. The

Symmetry in Low-Energy-Polarized-Electron Diffraction

May 14, 1979
Author(s)
G Wang, B Dunlap, Robert Celotta, Daniel T. Pierce
The first low-energy-electron diffraction measurements using a polarized incident electron beam are reported and compared to measurements where an unpolarized incident beam is analyzed after scattering. Whereas, because of multiple scattering, equivalence

Effect of Bound Hole Pairs on the d-Band Photoemission Spectrum of Ni

April 2, 1979
Author(s)
David R. Penn
It is shown that the spectral density of the Ni d electrons contains a peak due to excitations of bound hole pairs. The spectral density is observed directly in photoemission experiments which show a satellite peak below the bottom of the d bands. The

UV Photoemission for Rare Gases Implanted in Ge

August 21, 1978
Author(s)
B Waclawski, John William Gadzuk, J F. Herbst
The first ultraviolet photoemission spectra of the valence electrons of rare-gas atoms, implanted by ion bombardment into an amorphous Ge matrix, are presented here. The positions of the peaks in the observed spectra are shifted relative to gas-phase

Quantitative Surface Analysis by Electron Spectroscopy

April 1, 1978
Author(s)
Cedric J. Powell
An overview is given of a new cooperative project under the Implementing Agreement between the Technology Administration, U.S. Department of Commerce, and the Agency of Industrial Science and Technology, Japanese Ministry of International Trade and

Surface Analysis by Electron Spectroscopy at High Pressures

March 1, 1978
Author(s)
Cedric J. Powell
Surface analyses are now made by techniques such as Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS), and appearance potential spectroscopy (APS). These techniques utilize low-energy electrons and have high surface sensitivity but

Auger Electron Spectroscopy

February 1, 1978
Author(s)
Cedric J. Powell
A convenient measure of surface sensitivity in Auger-electron spectroscopy (AES) and x-ray photoelectron spectroscopy (XPS) is the mean escape depth (MED). If the effects of elastic-electron scattering are neglected, the MED is equal to the electron

High Resolution Photoemission Study of Condensed Layers of Nitrogen and Carbon Monoxide

February 1, 1978
Author(s)
P R. Norton, R L. Tapping, H P. Broida, John William Gadzuk, B Waclawski
Values are reported for the absolute yields of KVV Auger electrons from beryllium and L 23VV Auger electrons from aluminum excited by 60- to 220-keV proton bombardment. The measurements were made using semi-infinite evaporated samples, and the results were

Quantitative Surface Analysis by X-Ray Photoelectron Spectroscopy

January 1, 1978
Author(s)
Cedric J. Powell
Measurements have been made of the relative intensities of the principal features in X-ray photoelectron spectra of indium, lead, and aluminum oxide and compared with those expected from a simple model for the photoemission process. Systematic effects in

Surface Characterization: Present Status and the Need for Standards

January 1, 1978
Author(s)
Cedric J. Powell
A summary is given of the present status and use of surface-characterization measurements in the United States. Attention is primarily devoted to those properties needed to characterize a solid surface, specifically the determination of surface composition
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