Stein, R.
(1976),
Electron Transmission Measurements of Electron Mean Free Path in Supported Thin Films from 1-5 keV, Surface Science
(Accessed March 13, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Electron Transmission Measurements of Electron Mean Free Path in Supported Thin Films from 1-5 keV
Published
Author(s)
R Stein
Abstract
Measurements are made of the transmission of medium energy electrons through in vacuo deposited films in order to determine the inelastic electron mean free path as a function of energy. Films of Al, Ge and Au are deposited in small increments on 20-30 ¿ carbon substrates supported by "holey" carbon films. The no-loss electron current is measured for each thickness as a continuous function of incident energy in the range of 1-5 keV. Although this preliminary experiment does not result in a precise separation of elastic and inelastic scattering effects, the attenuation lengths estimated are in reasonable agreement with measured and calculated in-elastic mean free paths. Elastic scattering cross sections appear to be smaller than estimated by simple theory.Citation
Surface Science
Volume
60
Issue
2
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created November 1, 1976, Updated October 12, 2021