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Manufacturing

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Displaying 876 - 900 of 2179

Economics of the U.S. Additive Manufacturing Industry

August 14, 2013
Author(s)
Douglas Thomas
There is a general concern that the US manufacturing industry has lost competitiveness with other nations. Additive manufacturing may provide an important opportunity for advancing US manufacturing while maintaining and advancing US innovation. Additive

NIST Ontological Visualization Interface for Standards: Users Guide

August 1, 2013
Author(s)
David J. Lechevalier, Anantha Narayanan Narayanan, Katherine C. Morris, Sean Reidy, Sudarsan Rachuri
The NIST Ontological Visualization Interface for Standards (NOVIS) was developed at the National Institute of Standards and Technology (NIST) to provide an interactive visual interface to the terminology used in a variety of standards related to

Production and Applications of Cellulose Nanomaterials

August 1, 2013
Author(s)
Michael T. Postek, Robert J. Moon, Alan Rudie, Michael Bilodeau
“Production and Applications of Cellulosic Nanomaterials” was intended to help organize and highlight the wide range of research being conducted worldwide on the science and technology of cellulose nanomaterials. The format of this book consists of short

Challenges of the Changing Robot Markets

July 19, 2013
Author(s)
Gurvinder S. Virk, Carol Herman, Roger V. Bostelman, Tamas Haidegger
Service robots are becoming an integrated part of daily life, entering even the most complex scenarios, yet at a slower pace than previously anticipated. This paper presents an overview of the changing area of robotics and the new challenges being faced

Metrological Challenges Introduced by New Tolerancing Standards

July 5, 2013
Author(s)
Ed Morse, Yue Peng, Vijay Srinivasan, Craig M. Shakarji
The recent release of ISO 14405-1 has provided designers with a richer set of specification tools for the size of part features, so that various functional requirements can be captured with greater fidelity. However, these tools also bring new challenges

Trace water vapor analysis in specialty gases: sensor and spectroscopic approaches

July 1, 2013
Author(s)
Kristine A. Bertness, Mark W. Raynor, Kevin C. Cossel, Florian B. Adler, Jun Ye
The analysis of water vapor impurity is important in a number of specialty gas applications. However the main driver for the development and advancement of trace H 2O analysis techniques has been the microelectronics industry. The International Technology

3D Ground-Truth Systems for Object/Human Recognition and Tracking

June 28, 2013
Author(s)
Afzal A. Godil, Roger V. Bostelman, Kamel Saidi, William P. Shackleford, Geraldine Cheok, Michael O. Shneier, Tsai H. Hong
We have been researching 3D ground-truth systems for performance evaluation of vision and perception systems in the fields of smart manufacturing and robotics safety. In this paper we first present an overview of different systems that have been used to

Measurement Science for 6DOF object pose ground truth

June 28, 2013
Author(s)
Roger D. Eastman, Jeremy Marvel, Joseph Falco, Tsai H. Hong
Users of perception systems in industrial manufacturing applications need standardized, third party ground truth procedures to validate system performance before deployment. Many manufacturing robotic applications require parts and assemblies to be

On the Field Evaporation Behavior of c-axis GaN Nanowires in Laser-Pulsed Atom Probe Tomography

June 26, 2013
Author(s)
Matthew D. Brubaker, Kristine A. Bertness, Norman A. Sanford, Brian Gorman, David R. Diercks, R Kirchofer
GaN has seen use in many applications such as photovoltaics, blue and ultraviolet lasers, and light-emitting diodes with additional research into expanded and new applications. GaN in the form of nanowires present additional possibilities due to their high

Dexterous Manipulation for Manufacturing Applications Workshop

June 21, 2013
Author(s)
Joseph A. Falco, Jeremy A. Marvel, Elena R. Messina
The National Institute of Standards and Technology organized a free workshop in conjunction with the 2013 Automate and ProMat trade shows in Chicago, IL. The workshop addressed the application of dexterous robot technologies to meet the application needs

ASME Journal of Computing and Information Science in Engineering (JCISE)

June 14, 2013
Author(s)
Vijay Srinivasan
For over a decade this journal has supported and advanced the research and applications at the intersection of information science and mechanical engineering. In that process it has established itself as a premier outlet for cutting edge research in the

CHARACTERIZING ENERGY CONSUMPTION OF THE INJECTION MOLDING PROCESS

June 14, 2013
Author(s)
Jatinder Madan, Mahesh Mani, Kevin W. Lyons
Presently available systems for sustainability assessment do not fully account for aspects related to a product’s manufacturing. In an effort to make more sustainable decisions, today’s industry seeks reliable methods to assess and compare sustainability

Inferring Intention Through State Representations in Cooperative Human-Robot Environments

June 7, 2013
Author(s)
Craig I. Schlenoff, Anthony Pietromartire, Zeid Kootbally, Stephen B. Balakirsky, Thomas R. Kramer, Sebti Foufou
In this paper, we describe a novel approach for inferring intention during cooperative human-robot activities through the representation and ordering of state information. State relationships are represented by a combination of spatial relationships in a

Development of a Methodology to Determine Risk of Counterfeit Use

June 5, 2013
Author(s)
Mark Schaffer, Yaw S. Obeng
Counterfeit components have become a multi-million dollar, yet undesirable, part of the electronics industry. The profitability of the counterfeit industry rests in large part on its ability to recognize supply constraints and quickly respond, effectively

High Accuracy Measurements Using a Scanning System with a Single Point Triangulation Sensor

May 13, 2013
Author(s)
Theodore D. Doiron, Wei Ren, Eric S. Stanfield, Balasubramanian Muralikrishnan, Christopher J. Blackburn
The capabilities of non-contact laser spot triangulation sensors for high accuracy measurements have slowly increased over the past decade, and now have usable resolution below 0.1 µm. The Dimensional Metrology Group has developed a simple scanning system
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