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Electronics

Optoelectronics

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Displaying 151 - 175 of 200

Improved Thermal Detector Coatings for Laser Radiometry at NIST

February 27, 2006
Author(s)
John H. Lehman
Nearly all of the radiometric standards for laser power and energy measurements at NIST and elsewhere in the world are based on thermal detectors. These detectors usually rely on a thermal absorber coating to enhance the detector responsivity. Ideally the

The Next Generation of Laser Radiometry at NIST

February 27, 2006
Author(s)
John H. Lehman, Christopher L. Cromer, Marla L. Dowell
High accuracy laser radiometry is on the verge of significant improvements just as new laser technologies are evolving. Our present tasks are directed toward anticipating and meeting the measurement needs in two areas; higher power and shorter wavelengths

Application of carbon nanotube coatings for laser measurements

October 17, 2005
Author(s)
John H. Lehman, Paul Rice, Natalia Varaksa, Chaiwat Engtrakul, Anne Dillon
We have demonstrated coatings based on carbon nanotubes (CNTs) on a variety of detector platforms for laser power and energy measurement standards. These coatings must be resistant to damage and aging while maintaining desirable optical and thermal

Importance of Display Metrology in a Competitive World

April 26, 2005
Author(s)
Edward F. Kelley
How do contrast, brightness, viewing angle, and other parameters affect the quality of a display? Do the specifications always tell you what you want to know? Is specsmanship a problem? Why is a solid bedrock of display metrology important for the highly

What Do the Specifications Mean?

October 1, 2004
Author(s)
Edward F. Kelley
Specifications and "specsmanship" continue to confuse people despite the fact that a solid metrological basis exists for communicating display performance. We review some of the misunderstandings encountered in the display industry and encourage uniformity

Luminance probes for contrast measurements in medical displays

May 1, 2003
Author(s)
Aldo Badano, Scott Pappada, Edward F. Kelley, Michael J. Flynn, Sandrine Martin, Jerzy Kanicki
We report on a comparative study that examines four conic luminance probes in their ability to measure small-spot display contrast. We performed linear scans of a slit using a computer-controlled stage. We found that, although the probes were assembled

Current Projects in Display Metrology at the NIST Flat Panel Display Laboratory

February 1, 2003
Author(s)
Paul A. Boynton, Edward F. Kelley, John M. Libert
The NIST Flat Panel Display Laboratory (FPDL) is operated through the Display Metrology Project (DMP) of the Electronic Information Technology Group in the Electricity Division of the Electronics and Electrical Engineering Laboratory of NIST. The DMP works

Calibrating Photoreceiver Response to 110 GHz

November 13, 2002
Author(s)
Tracy S. Clement, Dylan F. Williams, Paul D. Hale, Juanita M. Morgan
We have measured the magnitude and phase responses of a photoreceiver to 110 GHz using a calibrated electro-optic sampling system. The frequency range of the calibration is limited only by our 1 mm coaxial connectors.

Sensitivity of Display Reflection Measurements to Apparatus Geometry

May 21, 2002
Author(s)
Edward F. Kelley
Reflection measurements made upon electronic displays can suffer from non-reproducibility owing to their possible strong dependence upon apparatus geometry. The geometrical dependence arises from non-Lambertian diffusion properties. We show the

Fundamentals of Display Metrology

May 19, 2002
Author(s)
Edward F. Kelley
Display metrology is discussed as applied to electronic displays and especially flat panel displays (FPDs). Topics include the importance of proper set up, expected measurement uncertainty vs. repeatability, and problems in making accurate light

NIST Stray Light Elimination Tube Prototype

March 1, 2002
Author(s)
Paul A. Boynton, Edward F. Kelley
Electronic projection displays involve the projection of an image, usually through a lens system, onto a viewing screen. Metrics such as light output, contrast, non-uniformity, and color gamut are used to describe the resultant image quality. although

SAE J1757 Committee Report on Proposed Reflection Measurement Methods

November 1, 2001
Author(s)
Edward F. Kelley
This is a report to the committee regarding reflection measurements that impact the current draft standard. Diffuse reflectance measurements are compared to transmitting diffuser measurements of several flat panel displays and samples in attempts to show

Microdisplay Metrology Research at NIST

September 14, 2001
Author(s)
Paul A. Boynton
Measuring the optical characteristics of a microdisplay produces challenges to traditional display metrology. When using light-measuring devices to measure scenes having high contrasts or wide color variations, the instruments suffer the effects of veiling

Measuring the Frequency Response of Gigabit Chip Photodiodes

September 1, 2001
Author(s)
Paul D. Hale, Tracy S. Clement, Dylan F. Williams, E. Balta, N. D. Taneja
We describe a calibratin and measurement procedure for determining the intrinsic frequency response fo gigabit chip photodiodes embedded in simple test fixtures. The procedure is unique because we make the measurements in the time-domain using a calibrated

Compensation for Stray Light in Projection Display Metrology

June 30, 2001
Author(s)
Paul A. Boynton, Edward F. Kelley
Electronic projection display specifications are often based on measurements made in ideal darkroom conditions and assume ideal measurement instrumentation. However, not everyone has access to such a facility, and not always will the light-measuring
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