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Electronics

Optoelectronics

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Displaying 126 - 150 of 202

Electron Microscope Study of Strain in InGaN Quantum Wells in GaN Nanowires

April 1, 2009
Author(s)
Roy H. Geiss, David T. Read
GaN nanowires with InGaN quantum wells (QW) were grown on heated Si(111) substrates by molecular beam epitaxy (MBE) using elemental Ga and In and a radio-frequency-plasma N2 source. The growth procedures and the morphology of these nanowires have been

EEEL Technical Accomplishments

March 30, 2009
Author(s)
Erik M. Secula
This document describes the technical work of the Electronics and Electrical Engineering Laboratory. In this report, you will find that EEEL researchers are developing the world's most advanced sensors, providing advanced gamma ray imagers for astronomical

Calculation of pulse parameters and propagation of uncertainty

March 1, 2009
Author(s)
Paul D. Hale, Chih-Ming Wang
The fundamental starting point for the analysis of all two-state waveforms is the determination of the low- and highstate levels. This is a two-step process. First, the data are grouped into points belonging to each state, and second, the value of each

Measuring optical waveforms with fiber frequency combs

January 5, 2009
Author(s)
Ian R. Coddington, William C. Swann, Nathan R. Newbury
A stabilized frequency comb provides a broadband array of highly resolved comb lines. Using a multiheterodyne technique, we measure the amplitude and phase of every comb line, allowing for massively parallel, high-resolution optical sampling.

Character contrast

January 1, 2009
Author(s)
Edward F. Kelley
Measurement of a small black area on a white electronic display screen is often accompanied by serious contamination from veiling glare in the detector. The black measurement can be thousands of percent in error. Character-stroke-contrast or small-area

Reflective optical chopper used in NIST high-power laser measurements

November 1, 2008
Author(s)
Xiaoyu X. Li, Thomas Scott, Christopher L. Cromer, Joshua A. Hadler
For the past ten years, NIST has used high-reflectivity, optical choppers as beamsplitters and attenuators when calibrating the absolute responsivity and response linearity of detectors used with high-power CW lasers. The chopper-based technique has

Robustness of display hemispherical reflectance measurement apparatus

October 1, 2008
Author(s)
John Penczek, Edward F. Kelley, Seugkwan Kim
Reflection measurements are critical to the evaluation of display performance under ambient illumination conditions. Various hemispherical reflection methods are evaluated for their suitability and robustness across display technologies. The standard

Ultra-low-noise all-fiber photon pair source

August 21, 2008
Author(s)
Shellee D. Dyer, Martin J. Stevens, Burm Baek, Sae Woo Nam
We demonstrate an all-fiber photon pair source with the highest coincidence-to-accidental ratio (CAR) reported to date in the fiber optic telecom C-band.

Synchronization monitoring of I/Q data and pulse carving misalignment for a serial-type 80-Gb/s RZ-DQPSK transmitter through optical/RF clock tone measurement

August 4, 2008
Author(s)
Jeffrey A. Jargon, Xiaoxia Wu, Louis Christen, Scott Nuccio, Omer F. Yilmaz, Loukas Paraschis, Yannick K. Lize, Alan Willner
We experimentally demonstrate a monitoring technique for determining misalignment between the in-phase/ quadrature (I/Q) data streams and between the data and pulse carving in an 80 Gb/s serial-type return-to-zero differential quadrature phase-shift-keying

Diffusion Confusion

February 1, 2008
Author(s)
Edward F. Kelley
We discuss the true definitions of specular and diffuse reflection. Many people think that diffuse reflection is Lambertian reflection. Such is not the case. Lambertian is a special type of diffuse reflection, and the often-used equations for Lambertian

Photoconductive lifetimes of carbon nanotubes films

November 29, 2007
Author(s)
Katie Hurst, Richard K. Ahrenkiel, Steve W. Johnston, Anne Dillon, Lara Roberson, John H. Lehman
The photoconductive recombination lifetimes of carbon nanotube (CNT) thin films as a function of wavelength are measured by resonant-coupled photoconductive decay (RCPCD) method (1). The carrier recombination lifetime is a fundamental property of carbon

Accurate color measurement methods for medical displays

February 15, 2007
Author(s)
Anindita Saha, Hongye Liang, Aldo Badano, Edward F. Kelley
We report on the characterization of two novel probes for measuring display color without contamination from other screen areas or off-normal emissions. The probes are characterized using a scanning slit method and a moving laser and LED arrangement. The

Reflections on Sunlight-or Daylight-Readability

January 1, 2007
Author(s)
Edward F. Kelley
Trade magazine discussion of the need for better sunlight-readability measurement methods based upon ambient contrast measurements. Diffuse reflectance measurements and directed illumination measurements are combined and scaled to daylight levels to

Quantum dot single photon sources studied with superconducting single photon detectors

November 1, 2006
Author(s)
Martin J. Stevens, Robert Hadfield, Robert E. Schwall, Sae Woo Nam, Richard P. Mirin
We report the observation of photon antibunching from a single, self-assembled InGaAs quantum dot (QD) at temperatures up to 135 K. The second-order intensity correlation, g(2)(0), is less than 0.260 ± 0.024 for temperatures up to 100 K. At 120 K, g(2)(0)
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