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Electronics

Optoelectronics

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Displaying 176 - 200 of 200

Frequency Response Metrology for High-Speed Optical Receivers

March 1, 2001
Author(s)
Paul D. Hale, Tracy S. Clement, Dylan F. Williams
There are two types of optical sources whose modulation can be measured or calculated from fundamental principles: the hererodyne beat between two single- frequency lasers (frequency-domain) and the short pulse from a mode-locked laser (time-domain). While

Impediments to Reproducibility in Display Metrology

January 11, 2001
Author(s)
Edward F. Kelley
Most people are surprised to learn of the complexities of measuring the performance of electronic displays. Serious errors are encountered in even seemingly simple measurements if we blithely measure displays without being aware of the pitfalls. We discuss

Measurements of Static Noise in Display Images

January 1, 2001
Author(s)
John W. Roberts, Edward F. Kelley
The appearance of noise on a display is an important usability issue. Sources of noise include electrical interference, display driver artifacts, resampling artifacts, transmission artifacts, compression artifacts, and any intrinsic noise artifacts

Mismatch Corrections for Electro-Optic Sampling Systems

December 1, 2000
Author(s)
Dylan F. Williams, Paul D. Hale, Tracy S. Clement, Juanita M. Morgan
We develop and apply frequency-domain mismatch corrections to a temporal electro-optic sampling system. We use these corrections to characterize the magnitude and phase of electrical sources that are physically far removed from the point at which the

An Assessment Standard for the Evaluation of Display Measurement Capabilities

November 1, 2000
Author(s)
John M. Libert, Paul A. Boynton, Edward F. Kelley, Steven W. Brown, Yoshi Ohno
A prototype display measurement assessment transfer standard (DMATS) is being developed by NIST to assist the display industry in standardizing measurement methods used to quantify the performance of electronic displays. Designed as an idealized electronic

Meeting the Metrology Needs of the Microdisplay Industry

August 31, 2000
Author(s)
Paul A. Boynton, Edward F. Kelley, John M. Libert
Measuring the optical characteristics of microdisplays produce challenges to traditional display metrology. When using light-measuring devices to measure scenes having high contrasts or wide color variations, they suffer the effects of veiling glare or

Mosquito Noise in MPEG-compressed Video: Test Patterns and Metrics

June 24, 2000
Author(s)
Charles D. Fenimore, John M. Libert, Peter Roitman
Mosquito noise is a time dependent video compression impairment in which the high frequency spatial detail in video images having crisp edges is aliased intermittently. A new synthetic test pattern of moving spirals or circles is described which generates

Diagnostics for Light Measuring Devices in Flying-spot Display Measurements

January 31, 2000
Author(s)
Paul A. Boynton, Edward F. Kelley, S. Highnote, R. Hurtado
Flying-spot displays, such as some laser projection displays, use a high-energy beam as a light source that scans the image across the display screen. Each pixel can be a narrow, high-energy pulse. When such displays are measured with convential light

Simulated-eye-design Camera for High-Contrast Measurements

January 30, 1999
Author(s)
Edward F. Kelley
Light-measurement instrumentation based upon high-quality charge-coupled-devices (CCD) is currently in use for measuring the characteristics of electronic displays. When such array detectors are used to measure scenes having high contrasts or wide color

Reflection Measurement Problems Arising from Haze

August 1, 1998
Author(s)
George R. Jones Jr., Edward F. Kelley
Irreproducibility in some reflection measurement methods arises from the observance of the haze component of reflection (non-regular-specular, non-Lambertian). Because of the haze component, the measured reflection is sensitive to the apparatus

Assessment of Color Measurement Systems Using Interference Filters

July 1, 1998
Author(s)
Paul A. Boynton, Eric Kelley
Spectroradiometers and tristimulus colorimeters are used in display measurements to measure color in one of several color space coordinate systems. How well these instruments can measure the color coordinates can be simply checked by using interference

A bibliography of the NIST Optoelectronics Division

September 1, 1995
Author(s)
Linda Derr, Annie J. Smith
This bibliography provides one means of access to the work of the division. It includes most of the papers published by the Division and its predecessor organization since 1970. A few important earlier papers and a few papers published by present NIST

Transfer function approach to the experimental determination of mode transfer matrices

July 20, 1990
Author(s)
Shao Yang, Igor Vayshenker, D. R. Hjelme, I. P. Januar, A. R. Mickelson
An improved scheme for characterization of multimode fiber systems is investigated. Characterization with transfer matrices requires multiple measurements for each component. The transfer function approach herein investigated requires only a single launch

Transfer function analysis of measured transfer matrices

August 1, 1989
Author(s)
Shao Yang, Igor Vayshenker, A. R. Mickelson
Measurements of mode transfer matrices of various multimode fiber optic connectors are presented. To analyze the accuracy and repeatability of such measurements, a theoretical framework which employs mode transmission functions is derived. It is shown that
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