Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Polarization dependent photoluminescence of elliptical quantum dots defined by lithographic patterning

Published

Author(s)

Varun B. Verma, Martin J. Stevens, Kevin L. Silverman, Neville Dias, Akash Garg, James J. Coleman, Richard P. Mirin

Abstract

We measure the polarization state of the photoluminescence of elliptically shaped lithographically patterned quantum dots fabricated using a wet etching and regrowth technique. We show that the dipole moment of the ground state of elliptical quantum dots is predominantly aligned with the major axis of the ellipse. The lithographic patterning technique allows for the arbitrary orientation of the ellipse, allowing control over the polarization state of emission. This technique may prove useful for polarization control of single photon sources as well as spatial and spectral mode control in vertical cavity lasers.
Citation
Applied Physics Letters
Volume
109
Issue
12

Keywords

quantum dot, polarization, single photon

Citation

Verma, V. , Stevens, M. , Silverman, K. , Dias, N. , Garg, A. , Coleman, J. and Mirin, R. (2011), Polarization dependent photoluminescence of elliptical quantum dots defined by lithographic patterning, Applied Physics Letters, [online], https://doi.org/10.1063/1.3599889 (Accessed October 8, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created June 15, 2011, Updated November 10, 2018